Excellent Mechanical Durability of In‐Folding Stress of Poly‐Si Thin‐Film Transistor on Plastic Substrate Compared with Out‐Folding: Generation of Gate Leakage Currents in Flexible Poly‐Si Thin‐Film Transistor by Out‐Folding and Bias‐Temperature Stress

Advanced Engineering Materials ◽

10.1002/adem.202000901 ◽

2020 ◽

pp. 2000901

Author(s):

Dongjin Kim ◽

Mohammad Masum Billah ◽

Suhui Lee ◽

Abu Bakar Siddik ◽

Young Joo Cho ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistor ◽

Plastic Substrate ◽

Gate Leakage ◽

Leakage Currents ◽

Mechanical Durability ◽

Bias Temperature Stress ◽

Si Thin Film

ON-Current Stability of Poly-Si Thin Film Transistor with Si-rich Oxide as Intermetal Dielectric Film after Negative Bias Temperature Stress

10.7567/ssdm.1994.ld-18 ◽

1994 ◽

Author(s):

Gug-Seon Choi ◽

Jin-Ho Choi ◽

Yoon-Jong Lee ◽

Jong-Wan Nam ◽

Sook-Rak Ma ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Dielectric Film ◽

Thin Film Transistor ◽

Negative Bias ◽

Bias Temperature Stress ◽

Intermetal Dielectric ◽

Si Thin Film

Instability of p-channel poly-Si thin-film transistors under dynamic negative bias temperature stress

2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2010.5531996 ◽

2010 ◽

Cited By ~ 4

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Bias Temperature Stress ◽

Si Thin Film

Two-Stage Degradation of p-Channel Poly-Si Thin-Film Transistors Under Dynamic Negative Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2158582 ◽

2011 ◽

Vol 58 (9) ◽

pp. 3034-3041 ◽

Cited By ~ 14

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Two Stage ◽

Bias Temperature Stress ◽

Si Thin Film

A Two-Stage Degradation Model of p-Channel Low-Temperature Poly-Si Thin-Film Transistors Under Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2160949 ◽

2011 ◽

Vol 58 (10) ◽

pp. 3501-3505 ◽

Cited By ~ 5

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Two Stage ◽

Degradation Model ◽

Bias Temperature Stress ◽

Si Thin Film

Abnormal double-hump phenomenon in amorphous In-Ga-Zn-O thin-film transistor under positive gate bias temperature stress

Solid-State Electronics ◽

10.1016/j.sse.2020.107875 ◽

2020 ◽

Vol 172 ◽

pp. 107875

Author(s):

Yongjo Kim ◽

Tae-Kyoung Ha ◽

SangHee Yu ◽

GwangTae Kim ◽

Hoon Jeong ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistor ◽

Gate Bias ◽

Bias Temperature Stress

Stability of Amorphous InGaZnO Thin-Film Transistor: Photo Induced Bias Temperature Stress

ECS Meeting Abstracts ◽

10.1149/ma2011-01/24/1493 ◽

2011 ◽

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistor ◽

Bias Temperature Stress ◽

Amorphous Ingazno

Degradation process by effect of water molecules during negative bias temperature stress in amorphous-InGaZnO thin-film transistor

Japanese Journal of Applied Physics ◽

10.7567/jjap.56.108001 ◽

2017 ◽

Vol 56 (10) ◽

pp. 108001 ◽

Cited By ~ 4

Author(s):

Yeol-Hyeong Lee ◽

Yong-Jung Cho ◽

Woo-Sic Kim ◽

Jeong Ki Park ◽

Geon Tae Kim ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistor ◽

Degradation Process ◽

Water Molecules ◽

Negative Bias ◽

Effect Of Water ◽

Bias Temperature Stress ◽

Amorphous Ingazno

Positive bias temperature stress induced degradation in p-channel poly-Si thin-film transistors

18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2011.5992774 ◽

2011 ◽

Cited By ~ 2

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Bias Temperature Stress ◽

Si Thin Film

Study of the Vth shift of the thin-film transistor by the bias temperature stress test

IBM Journal of Research and Development ◽

10.1147/rd.361.0076 ◽

1992 ◽

Vol 36 (1) ◽

pp. 76-82 ◽

Cited By ~ 10

Author(s):

Y. Fujimoto

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Stress Test ◽

Thin Film Transistor ◽

Bias Temperature Stress

Characteristics of New Poly-Si Thin Film Transistor with a-Si Channel Region Near the Source/Drain

Japanese Journal of Applied Physics ◽

10.1143/jjap.37.1064 ◽

1998 ◽

Vol 37 (Part 1, No. 3B) ◽

pp. 1064-1066 ◽

Cited By ~ 2

Author(s):

Jae-Hong Jeon ◽

Cheol-Min Park ◽

Juhn-Suk Yoo ◽

Cheon-Hong Kim ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Thin Film Transistor ◽

Channel Region ◽

Si Thin Film