ON-Current Stability of Poly-Si Thin Film Transistor with Si-rich Oxide as Intermetal Dielectric Film after Negative Bias Temperature Stress

1994 ◽  
Author(s):  
Gug-Seon Choi ◽  
Jin-Ho Choi ◽  
Yoon-Jong Lee ◽  
Jong-Wan Nam ◽  
Sook-Rak Ma ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Dielectric Film ◽  
Thin Film Transistor ◽  
Negative Bias ◽  
Bias Temperature Stress ◽  
Intermetal Dielectric ◽  
Si Thin Film

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

2013 ◽  
Vol 9 (S1) ◽  
pp. 13-16 ◽  
Author(s):  
Yu-Mi Kim ◽  
Kwang-Seok Jeong ◽  
Ho-Jin Yun ◽  
Seung-Dong Yang ◽  
Sang-Youl Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Silicon Thin Film ◽  
Poly Silicon ◽  
Bias Temperature Stress

Improving Negative-Bias-Temperature-Stress Stability for Thin-Film Transistors by Doping Mg Into ScInO Semiconductor

2019 ◽  
Vol 66 (6) ◽  
pp. 2620-2623 ◽  
Author(s):  
Linfeng Lan ◽  
Xingqiang Dai ◽  
Changchun He ◽  
Lu Liu ◽  
Xiaobao Yang ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Bias Temperature Stress

Abnormal double-hump phenomenon in amorphous In-Ga-Zn-O thin-film transistor under positive gate bias temperature stress

2020 ◽  
Vol 172 ◽  
pp. 107875
Author(s):  
Yongjo Kim ◽  
Tae-Kyoung Ha ◽  
SangHee Yu ◽  
GwangTae Kim ◽  
Hoon Jeong ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Bias Temperature Stress
Sign in / Sign up

Export Citation Format

Share Document