scholarly journals In Situ Monitoring of Pit Nucleation and Growth at an Iron Passive Oxide Layer by using Combined Atomic Force and Scanning Electrochemical Microscopy

2015 ◽  
Vol 2 (11) ◽  
pp. 1847-1856 ◽  
Author(s):  
Javier Izquierdo ◽  
Alexander Eifert ◽  
Christine Kranz ◽  
Ricardo M. Souto
1999 ◽  
Vol 570 ◽  
Author(s):  
J. A. Venables ◽  
G. Haas ◽  
H. Brune ◽  
J.H. Harding

ABSTRACTNucleation and growth of metal clusters at defect sites is discussed in terms of rate equation models, which are applied to the cases of Pd and Ag on MgO(001) and NaCl(001) surfaces. Pd/MgO has been studied experimentally by variable temperature atomic force microscopy (AFM). The island density of Pd on Ar-cleaved surfaces was determined in-situ by AFM for a wide range of deposition temperature and flux, and stays constant over a remarkably wide range of parameters; for a particular flux, this plateau extends from 200 K ≤ T ≤ 600 K, but at higher temperatures the density decreases. The range of energies for defect trapping, adsorption, surface diffusion and pair binding are deduced, and compared with earlier data for Ag on NaCl, and with recent calculations for these metals on both NaCl and MgO


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