ChemInform Abstract: Synthesis and Characterization of the New Copper Indium Phosphate Cu8In8P4O30.

ChemInform ◽  
2014 ◽  
Vol 45 (16) ◽  
pp. no-no
Author(s):  
Christian Hanzelmann ◽  
Iren Weimann ◽  
Joerg Feller ◽  
Zdirad Zak
2013 ◽  
Vol 640 (1) ◽  
pp. 213-218 ◽  
Author(s):  
Christian Hanzelmann ◽  
Iren Weimann ◽  
Jörg Feller ◽  
Zdirad Žak

2011 ◽  
Vol 304 ◽  
pp. 119-123
Author(s):  
Zhen Dong Wang ◽  
Zhen Quan Lai ◽  
Guo Rong Chen

We report herein synthesis and characterization of CuInS2and CuInSe2compounds by vacuum sintering method. In this study, the manual-milled and ball-milled precursors including copper, indium, and sulfur (selenium) elements were sintered under vacuum at different temperatures for synthesis of CuInS2and CuInSe2compounds, respectively. The crystal structure, morphology and Raman property of the sintered powder were investigated by X-ray diffraction, scanning electron microscope and Raman scattering spectroscopy, respectively. The results show that the structure of the products, which was sintered with the manual-milled and ball-milled precursors, were transformed into the single chalcopyrite phase CuInS2powder at 923K and 623K, and the grain size are about 2~3μm and 250 nm, respectively. In addition, the CuInSe2 powder was synthesized about 723K via using the ball-milled powder including copper, indium, and selenium elements as the precursor.


2013 ◽  
Vol 106 ◽  
pp. 79-82 ◽  
Author(s):  
Huiyu Chen ◽  
Dan Nie ◽  
Chunju Xu ◽  
Guizhe Zhao ◽  
Yaqing Liu

2020 ◽  
Author(s):  
Shikshita Jain ◽  
Shivani Bharti ◽  
Gurvir Kaur ◽  
S. K. Tripathi

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


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