Theoretical analyses of NH 3 ‐SCR reaction‐mass transfer over Cu‐ZSM ‐5

2021 ◽  
Author(s):  
Chao Zhong ◽  
Chenxi Wu ◽  
Hongyan Zuo ◽  
Zhong Gu
Keyword(s):  
Mass Transfer ◽  
Reaction Mass ◽  
Theoretical Analyses

Extents of Reaction, Mass Transfer and Flow for Gas−Liquid Reaction Systems

2010 ◽  
Vol 49 (17) ◽  
pp. 7704-7717 ◽  
Author(s):  
Nirav Bhatt ◽  
Michael Amrhein ◽  
Dominique Bonvin
Keyword(s):  
Mass Transfer ◽  
Reaction Mass ◽  
Reaction Systems ◽  
Liquid Reaction

Design optimisation study of solvent extraction: chemical reaction, mass transfer and mixer–settler hydrodynamics

2004 ◽  
Vol 74 (1-2) ◽  
pp. 131-147 ◽  
Author(s):  
Gilberto A. Pinto ◽  
Fernando O. Durão ◽  
António M.A. Fiúza ◽  
Margarida M.B.L. Guimarães ◽  
C.M.Novais Madureira
Keyword(s):  
Mass Transfer ◽  
Solvent Extraction ◽  
Chemical Reaction ◽  
Reaction Mass ◽  
Design Optimisation

Resolution in the scanning tunneling microscope

1991 ◽  
Vol 49 ◽  
pp. 488-489
Author(s):  
R. J. Wilson ◽  
D. D. Chambliss ◽  
S. Chiang ◽  
V. M. Hallmark
Keyword(s):  
Scanning Tunneling Microscope ◽  
Fundamental Principle ◽  
Atomic Scale ◽  
Lateral Resolution ◽  
Scanning Tunneling ◽  
Electronic Noise ◽  
Vertical Resolution ◽  
Tunneling Microscopy ◽  
Spatial Profile ◽  
Theoretical Analyses

Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral resolution in STM depends upon the spatial profile of electronic states of both the sample and tip at energies near the Fermi level. Vertical resolution is typically limited by mechanical and electronic noise.

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