Relation between work function and structural properties of triangular defects in 4H-SiC epitaxial layer: Kelvin probe force microscopic and spectroscopic analyses

In the defective SiC epitaxial layer, the work function variation was observed by Kelvin probe force microscopy (KPFM), and the work function difference came from the variation of polytype and the disordered surface.

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Work function difference of naphthyl end-capped oligothiophene in different crystal alignments studied by Kelvin probe force microscopy

Organic Electronics ◽

10.1016/j.orgel.2020.106060 ◽

2020 ◽

pp. 106060

Author(s):

Mads Nibe Larsen ◽

Mads Svanborg Peters ◽

Rodrigo Lemos-Silva ◽

Demetrio A. Da Silva Filho ◽

Bjarke Jørgensen ◽

...

Keyword(s):

Work Function ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Work Function Difference ◽

Function Difference

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Unraveling nanoscale conduction and work function in a poly(3,4-ethylenedioxypyrrole)/carbon nanotube composite by Kelvin probe force microscopy and conducting atomic force microscopy

Electrochimica Acta ◽

10.1016/j.electacta.2012.03.051 ◽

2012 ◽

Vol 70 ◽

pp. 228-240 ◽

Cited By ~ 11

Author(s):

B. Narsimha Reddy ◽

Melepurath Deepa

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Work Function ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Carbon Nanotube Composite

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Local work function of a rutile TiO2()-(1×1) surface observed by Kelvin probe force microscopy

Surface Science ◽

10.1016/s0039-6028(03)00031-1 ◽

2003 ◽

Vol 529 (1-2) ◽

pp. L245-L250 ◽

Cited By ~ 20

Author(s):

Akira Sasahara ◽

Hiroshi Uetsuka ◽

Hiroshi Onishi

Keyword(s):

Work Function ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Rutile Tio2 ◽

Force Microscopy ◽

Local Work

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Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function

Materials Science and Engineering B ◽

10.1016/s0921-5107(03)00020-5 ◽

2003 ◽

Vol 102 (1-3) ◽

pp. 138-142 ◽

Cited By ~ 56

Author(s):

Th. Glatzel ◽

S. Sadewasser ◽

R. Shikler ◽

Y. Rosenwaks ◽

M.Ch. Lux-Steiner

Keyword(s):

Work Function ◽

Surface Defects ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Local Work ◽

Effect Of Surface

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Mechanical Stress Characterization of Shallow Trench Isolation by Kelvin Probe Force Microscopy

MRS Proceedings ◽

10.1557/proc-568-245 ◽

1999 ◽

Vol 568 ◽

Cited By ~ 13

Author(s):

Hernan Rueda ◽

James Slinkman ◽

Dureseti Chidambarrao ◽

Leon Moszkowicz ◽

Phil Kaszuba ◽

...

Keyword(s):

Finite Element ◽

Work Function ◽

Mechanical Stress ◽

Mechanical Strain ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Shallow Trench Isolation ◽

Force Microscopy ◽

Trench Isolation

ABSTRACTmethod for characterizing the mechanical stress induced in silicon technology is described. Analysis by scanning Kelvin probe force microscopy (SKPM) coupled with finite-element (FE) mechanical strain simulations is performed. The SKPM technique detects variations in the semiconductor work function due to strain influences on the band gap. This technique is then used to analyze the strain induced by shallow trench isolation processes for electrical isolation. The SKPM measurements agree with the FE simulations qualitatively.

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Local charge writing in epitaxial SmNiO3 thin films

Journal of Materials Chemistry C ◽

10.1039/c4tc00030g ◽

2014 ◽

Vol 2 (19) ◽

pp. 3805-3811 ◽

Cited By ~ 4

Author(s):

Feng Yan ◽

Frank Schoofs ◽

Jian Shi ◽

Sieu D. Ha ◽

R. Jaramillo ◽

...

Keyword(s):

Thin Films ◽

Work Function ◽

Insulator Transition ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Metal Insulator Transition ◽

Metal Insulator ◽

Force Microscopy ◽

Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

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Work Function Modification in P3HT H/J Aggregate Nanostructures Revealed by Kelvin Probe Force Microscopy and Photoluminescence Imaging

ACS Nano ◽

10.1021/acsnano.5b03422 ◽

2015 ◽

Vol 9 (7) ◽

pp. 7105-7112 ◽

Cited By ~ 39

Author(s):

Mina Baghgar ◽

Michael D. Barnes

Keyword(s):

Work Function ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.4.49 ◽

2013 ◽

Vol 4 ◽

pp. 418-428 ◽

Cited By ~ 30

Author(s):

Alex Henning ◽

Gino Günzburger ◽

Res Jöhr ◽

Yossi Rosenwaks ◽

Biljana Bozic-Weber ◽

...

Keyword(s):

Work Function ◽

Surface Potential ◽

Dye Sensitized Solar Cells ◽

Kelvin Probe Force Microscopy ◽

Light Illumination ◽

Kelvin Probe ◽

Nanocrystalline Tio2 ◽

Force Microscopy ◽

Illumination System ◽

Surface Dipole

Dye-sensitized solar cells (DSCs) provide a promising third-generation photovoltaic concept based on the spectral sensitization of a wide-bandgap metal oxide. Although the nanocrystalline TiO2 photoelectrode of a DSC consists of sintered nanoparticles, there are few studies on the nanoscale properties. We focus on the microscopic work function and surface photovoltage (SPV) determination of TiO2 photoelectrodes using Kelvin probe force microscopy in combination with a tunable illumination system. A comparison of the surface potentials for TiO2 photoelectrodes sensitized with two different dyes, i.e., the standard dye N719 and a copper(I) bis(imine) complex, reveals an inverse orientation of the surface dipole. A higher surface potential was determined for an N719 photoelectrode. The surface potential increase due to the surface dipole correlates with a higher DSC performance. Concluding from this, microscopic surface potential variations, attributed to the complex nanostructure of the photoelectrode, influence the DSC performance. For both bare and sensitized TiO2 photoelectrodes, the measurements reveal microscopic inhomogeneities of more than 100 mV in the work function and show recombination time differences at different locations. The bandgap of 3.2 eV, determined by SPV spectroscopy, remained constant throughout the TiO2 layer. The effect of the built-in potential on the DSC performance at the TiO2/SnO2:F interface, investigated on a nanometer scale by KPFM measurements under visible light illumination, has not been resolved so far.

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