Depth-profile analysis from X-ray photoelectron spectroscopy on As-implanted ZnO activated in ozone ambient

2008 ◽  
Vol 43 (3) ◽  
pp. 289-292 ◽  
Author(s):  
T. S. Jeong ◽  
J. H. Kim ◽  
S. J. Bae ◽  
C. J. Youn
Keyword(s):  
Depth Profile ◽  
Photoelectron Spectroscopy ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
X Ray

X-Ray Photoelectron Spectroscopy Sputter Depth Profile Analysis of Spatially Controlled Microstructures in Conductive Polymer Films

1991 ◽  
Vol 63 (1) ◽  
pp. 60-65 ◽  
Author(s):  
Susan G. MacKay ◽  
Mohammad. Bakir ◽  
Inga H. Musselman ◽  
Thomas J. Meyer ◽  
Richard W. Linton
Keyword(s):  
Depth Profile ◽  
Polymer Films ◽  
Photoelectron Spectroscopy ◽  
Profile Analysis ◽  
Conductive Polymer ◽  
Depth Profile Analysis ◽  
X Ray

scholarly journals In-depth Profile Analysis in Metal/high-k Gate Stack Structures Studied by Synchrotron-radiation Photoelectron Spectroscopy

Hyomen Kagaku ◽  
2010 ◽  
Vol 31 (9) ◽  
pp. 441-447
Author(s):  
Satoshi TOYODA ◽  
Hiroyuki KAMADA ◽  
Hiroshi KUMIGASHIRA ◽  
Masaharu OSHIMA ◽  
Kunihiko IWAMOTO ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Depth Profile ◽  
Photoelectron Spectroscopy ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
Gate Stack ◽  
High K

Soft X-ray Emission Depth Profile Analysis: SXDA

1985 ◽  
Vol 24 (1) ◽  
pp. 34-56 ◽  
Author(s):  
A. Szász ◽  
J. Kojnok
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
X Ray
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