Compositional depth profile analysis of coatings on hard disks by X-ray photoelectron spectroscopy and imaging

2003 ◽  
Vol 176 (1) ◽  
pp. 93-102 ◽  
Author(s):  
Jianxia Gao ◽  
Erjia Liu ◽  
David Lee Butler ◽  
Aiping Zeng
Keyword(s):  
Depth Profile ◽  
Photoelectron Spectroscopy ◽  
Profile Analysis ◽  
Hard Disks ◽  
Depth Profile Analysis ◽  
X Ray ◽  
Compositional Depth Profile

X-Ray Photoelectron Spectroscopy Sputter Depth Profile Analysis of Spatially Controlled Microstructures in Conductive Polymer Films

1991 ◽  
Vol 63 (1) ◽  
pp. 60-65 ◽  
Author(s):  
Susan G. MacKay ◽  
Mohammad. Bakir ◽  
Inga H. Musselman ◽  
Thomas J. Meyer ◽  
Richard W. Linton
Keyword(s):  
Depth Profile ◽  
Polymer Films ◽  
Photoelectron Spectroscopy ◽  
Profile Analysis ◽  
Conductive Polymer ◽  
Depth Profile Analysis ◽  
X Ray

scholarly journals In-depth Profile Analysis in Metal/high-k Gate Stack Structures Studied by Synchrotron-radiation Photoelectron Spectroscopy

Hyomen Kagaku ◽  
2010 ◽  
Vol 31 (9) ◽  
pp. 441-447
Author(s):  
Satoshi TOYODA ◽  
Hiroyuki KAMADA ◽  
Hiroshi KUMIGASHIRA ◽  
Masaharu OSHIMA ◽  
Kunihiko IWAMOTO ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Depth Profile ◽  
Photoelectron Spectroscopy ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
Gate Stack ◽  
High K

Soft X-ray Emission Depth Profile Analysis: SXDA

1985 ◽  
Vol 24 (1) ◽  
pp. 34-56 ◽  
Author(s):  
A. Szász ◽  
J. Kojnok
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
X Ray
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