Business scenario evaluation using Monte Carlo simulation on qualitative and quantitative hybrid model

2010 ◽  
Vol 170 (3) ◽  
pp. 9-18 ◽  
Author(s):  
Masaki Samejima ◽  
Masanori Akiyoshi ◽  
Koshichiro Mitsukuni ◽  
Norihisa Komoda
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Hybrid Model ◽  
Qualitative And Quantitative ◽  
Scenario Evaluation

Secondary Fluorescence of 3D Heterogeneous Materials Using a Hybrid Model

2020 ◽  
Vol 26 (3) ◽  
pp. 484-496
Author(s):  
Yu Yuan ◽  
Hendrix Demers ◽  
Xianglong Wang ◽  
Raynald Gauvin
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Analytical Model ◽  
Hybrid Model ◽  
Three Dimensional ◽  
Heterogeneous Materials ◽  
X Ray ◽  
The Monte Carlo Method ◽  
Secondary Fluorescence ◽  
Good Agreement

AbstractIn electron probe microanalysis or scanning electron microscopy, the Monte Carlo method is widely used for modeling electron transport within specimens and calculating X-ray spectra. For an accurate simulation, the calculation of secondary fluorescence (SF) is necessary, especially for samples with complex geometries. In this study, we developed a program, using a hybrid model that combines the Monte Carlo simulation with an analytical model, to perform SF correction for three-dimensional (3D) heterogeneous materials. The Monte Carlo simulation is performed using MC X-ray, a Monte Carlo program, to obtain the 3D primary X-ray distribution, which becomes the input of the analytical model. The voxel-based calculation of MC X-ray enables the model to be applicable to arbitrary samples. We demonstrate the derivation of the analytical model in detail and present the 3D X-ray distributions for both primary and secondary fluorescence to illustrate the capability of our program. Examples for non-diffusion couples and spherical inclusions inside matrices are shown. The results of our program are compared with experimental data from references and with results from other Monte Carlo codes. They are found to be in good agreement.

Hybrid model of evaluation of underground lead—zinc mine capacity expansion project using Monte Carlo simulation and fuzzy numbers

SIMULATION ◽  
2011 ◽  
Vol 87 (8) ◽  
pp. 726-742 ◽  
Author(s):  
Zoran Gligoric ◽  
Cedomir Beljic ◽  
Branko Gluscevic ◽  
Sasa Jovanovic
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Hybrid Model ◽  
Fuzzy Numbers ◽  
Capacity Expansion ◽  
Lead Zinc ◽  
Zinc Mine

An efficient Monte Carlo simulation for new uncertain Heston–CIR hybrid model

2021 ◽  
Author(s):  
Behrouz Fathi-Vajargah ◽  
Mohammad Mirzazadeh ◽  
Sara Ghasemalipour
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Hybrid Model

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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