A variation of transmission electron microscope sample preparation for VLSI analysis

Cardiac sarcoplasmic reticulum (SR) is a complex system of intracellular tubules that, due to their small size and juxtaposition to such electron-dense structures as mitochondria and myofibrils, are often inconspicuous in conventionally prepared electron microscopic material. This study reports a method with which the SR is selectively “stained” which facilitates visualizationwith the transmission electron microscope.

Download Full-text

Surface Structure of the Spores of Glugea Weissenbergi

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010006310x ◽

1969 ◽

Vol 27 ◽

pp. 238-239

Author(s):

Sanford H. Vernick ◽

Anastasios Tousimis ◽

Victor Sprague

Keyword(s):

Electron Microscope ◽

Surface Structure ◽

Transmission Electron Microscope ◽

Mature Spore ◽

Spore Surface ◽

Sectioned Material ◽

Transmission Electron ◽

Surface Detail

Recent electron microscope studies have greatly expanded our knowledge of the structure of the Microsporida, particularly of the developing and mature spore. Since these studies involved mainly sectioned material, they have revealed much internal detail of the spores but relatively little surface detail. This report concerns observations on the spore surface by means of the transmission electron microscope.

Download Full-text

A New High Resolution Transmission Electron Microscope with Second-Zone Objective Lens

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100062798 ◽

1969 ◽

Vol 27 ◽

pp. 176-177 ◽

Cited By ~ 1

Author(s):

H. Tochigi ◽

H. Uchida ◽

S. Shirai ◽

K. Akashi ◽

D. J. Evins ◽

...

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Objective Lens ◽

High Excitation ◽

Transmission Electron ◽

New Instrument

A New High Excitation Objective Lens (Second-Zone Objective Lens) was discussed at Twenty-Sixth Annual EMSA Meeting. A new commercially available Transmission Electron Microscope incorporating this new lens has been completed.Major advantages of the new instrument allow an extremely small beam to be produced on the specimen plane which minimizes specimen beam damages, reduces contamination and drift.

Download Full-text

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100109847 ◽

1978 ◽

Vol 36 (1) ◽

pp. 540-541

Author(s):

G. Cliff ◽

M.J. Nasir ◽

G.W. Lorimer ◽

N. Ridley

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Weight Fraction ◽

Present Series ◽

Constant Independent ◽

X Ray ◽

Transmission Electron ◽

Series Of Experiments ◽

Image Position ◽

X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

Download Full-text

Aspects of microanalysis in a transmission electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100109690 ◽

1978 ◽

Vol 36 (1) ◽

pp. 510-511

Author(s):

R. Sinclair ◽

B.E. Jacobson

Keyword(s):

Grain Size ◽

Electron Beam ◽

Electron Microscope ◽

Chemical Analysis ◽

Transmission Electron Microscope ◽

Vapor Deposition ◽

Critical Currents ◽

X Ray ◽

Fine Grain ◽

Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

Download Full-text

The direct determination of magnetic domain wall profiles using a split detector STEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100109471 ◽

1978 ◽

Vol 36 (1) ◽

pp. 466-467

Author(s):

J.N. Chapman ◽

P.E. Batson ◽

E.M. Waddell ◽

R.P. Ferrier

Keyword(s):

Electron Microscope ◽

Domain Wall ◽

Transmission Electron Microscope ◽

Domain Walls ◽

Photographic Plate ◽

Magnetic Domain ◽

Direct Determination ◽

Quantitative Information ◽

Scanning Transmission Electron Microscope ◽

Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

Download Full-text