Design of thin‐structured‐light projection system for small‐height measurement

2021 ◽  
Author(s):  
Yuezong Wang ◽  
Jiqiang Chen ◽  
Youfan Peng ◽  
Yimeng Du
Keyword(s):  
Structured Light ◽  
Height Measurement ◽  
Projection System ◽  
Small Height

Convenient Calibration Procedure for Structured Light Projection System

2013 ◽  
Vol 662 ◽  
pp. 777-780
Author(s):  
Wen Guo Li ◽  
Shao Jun Duan
Keyword(s):  
Relative Position ◽  
Structured Light ◽  
Calibration Method ◽  
Calibration Procedure ◽  
Shape Measurement ◽  
Projection System ◽  
System Calibration ◽  
3D Shape ◽  
3D Shape Measurement ◽  
Projector Calibration

We present a convenient calibration method for structured light projection system. The proposed clibration approach can realize 3D shape measurement without projector calibration, without system calibration, without precise linear z stage to be used, the relative position between camera and projector can be arbitrary, and the only involved device is a plane board. Experiment results validated that the accuracy of the proposed approach.

Real-time interactive projection system based on infrared structured-light method

2012 ◽  
Author(s):  
Xiaorui Qiao ◽  
Qian Zhou ◽  
Kai Ni ◽  
Liang He ◽  
Guanhao Wu ◽  
...  
Keyword(s):  
Real Time ◽  
Structured Light ◽  
Projection System

Robust geometric, phase and colour structured light projection system calibration

2017 ◽  
Vol 25 (4) ◽  
pp. 326-336 ◽  
Author(s):  
K. Szelag ◽  
G. Maczkowski ◽  
R. Gierwialo ◽  
A. Gebarska ◽  
R. Sitnik
Keyword(s):  
Geometric Phase ◽  
Structured Light ◽  
Projection System ◽  
System Calibration

scholarly journals Flexible Digital Fringe Projection System for Step-height Measurement

2010 ◽  
Author(s):  
Song Zhang ◽  
James Oliver ◽  
Pramod K. Rastogi ◽  
Erwin Hack
Keyword(s):  
Step Height ◽  
Fringe Projection ◽  
Height Measurement ◽  
Projection System ◽  
Digital Fringe Projection

First Utilization of Energy Transfer in Structured Light Projection - Infrared 3D Scanner

2014 ◽  
Vol 613 ◽  
pp. 141-150 ◽  
Author(s):  
Ernst Wiedenmann ◽  
Thomas Scholz ◽  
Robert Schott ◽  
Jan Tusch ◽  
Andreas Wolf
Keyword(s):  
Optical Sensors ◽  
Structured Light ◽  
Visible Spectrum ◽  
Physical Principle ◽  
Projection System ◽  
Surface Data ◽  
High Measurement ◽  
First Results ◽  
Measurement Principle ◽  
First Time

In industrial metrology, the system of fringe projection for the fast determination of 3D surface data has been established. The combination of areal and structured projection with two-dimensional optical sensors and triangulation measurement principle allows very high measurement point densities with reasonable accuracy. There are great difficulties with high gloss surfaces and with very dark surfaces for state of the art systems. Transparent materials cannot be measured using the visible spectrum of light. We have therefore developed a new structured light projection system that solves these problems. For the first time the physical principle of energy conversion is utilized in areal structured light projection. We are presenting first results to show the advantages and the capability of this new measurement principle.

scholarly journals Calibration based on ray-tracing for multi-line structured light projection system

2019 ◽  
Vol 27 (24) ◽  
pp. 35884 ◽  
Author(s):  
Xiaoting Lu ◽  
Qingyang Wu ◽  
Haotao Huang
Keyword(s):  
Ray Tracing ◽  
Structured Light ◽  
Projection System
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