Simultaneous measurement of thickness and permittivity using microwave resonator‐based planar sensor

International Journal of RF and Microwave Computer-Aided Engineering ◽

10.1002/mmce.22794 ◽

2021 ◽

Author(s):

Luqman Ali ◽

Cong Wang ◽

Fan‐Yi Meng ◽

Yu‐Chen Wei ◽

Xiao Tan ◽

...

Keyword(s):

Simultaneous Measurement ◽

Microwave Resonator ◽

Measurement Of Thickness

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Non-contact acoustic method for the simultaneous measurement of thickness and acoustic properties of biological tissues

Ultrasonics ◽

10.1016/0041-624x(90)90064-u ◽

1990 ◽

Vol 28 (6) ◽

pp. 401-410 ◽

Author(s):

H. Okawai ◽

M. Tanaka ◽

F. Dunn

Keyword(s):

Simultaneous Measurement ◽

Acoustic Method ◽

Biological Tissues ◽

Acoustic Properties ◽

Measurement Of Thickness

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Line-Field Swept-Source Interferometer for Simultaneous Measurement of Thickness and Refractive Index Distribution

Journal of Lightwave Technology ◽

10.1109/jlt.2016.2605300 ◽

2017 ◽

Vol 35 (16) ◽

pp. 3584-3590 ◽

Author(s):

Soon-Woo Cho ◽

Gyeong Hun Kim ◽

Moonju Kim ◽

Bo Sung Shin ◽

Chang-Seok Kim

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Refractive Index Distribution ◽

Swept Source ◽

Index Distribution ◽

Measurement Of Thickness

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Simultaneous Measurement of Thickness and Temperature of Oil Film by Laser Induced Fluorescence.

TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C ◽

10.1299/kikaic.64.1808 ◽

1998 ◽

Vol 64 (621) ◽

pp. 1808-1813 ◽

Author(s):

Akihiko AZETSU ◽

Kei IKEDA

Keyword(s):

Simultaneous Measurement ◽

Laser Induced Fluorescence ◽

Oil Film ◽

Measurement Of Thickness

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Optical in-situ monitoring system for simultaneous measurement of thickness and curvature of thick layer stacks during hydride vapor phase epitaxy growth of GaN

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2015.07.019 ◽

2015 ◽

Vol 427 ◽

pp. 99-103 ◽

Author(s):

K. Semmelroth ◽

P. Berwian ◽

C. Schröter ◽

G. Leibiger ◽

M. Schönleber ◽

...

Keyword(s):

Monitoring System ◽

Vapor Phase ◽

Simultaneous Measurement ◽

Thick Layer ◽

Vapor Phase Epitaxy ◽

Hydride Vapor Phase Epitaxy ◽

In Situ Monitoring ◽

Measurement Of Thickness

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Simultaneous Measurement of Thickness and Refractive Index of Transparent Material Using a Collimated Beam Having a Finite Radius

Korean Journal of Optics and Photonics ◽

10.3807/hkh.2009.20.1.029 ◽

2009 ◽

Vol 20 (1) ◽

pp. 29-33 ◽

Author(s):

Dae-Seo Park ◽

Beom-Hoan O ◽

Se-Geun Park ◽

El-Hang Lee ◽

Seung-Gol Lee

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Transparent Material ◽

Finite Radius ◽

Measurement Of Thickness ◽

Collimated Beam

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A novel technique for in-situ simultaneous measurement of thickness of deposited film and electron density with two curling probes

Plasma Sources Science and Technology ◽

10.1088/1361-6595/ab7609 ◽

2020 ◽

Vol 29 (7) ◽

pp. 075009

Author(s):

Daisuke Ogawa ◽

Keiji Nakamura ◽

Hideo Sugai

Keyword(s):

Electron Density ◽

Simultaneous Measurement ◽

Novel Technique ◽

Deposited Film ◽

Measurement Of Thickness

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Non-destructive simultaneous measurement of thickness and elastic modulus by laser ultrasonic method

The Proceedings of the Materials and processing conference ◽

10.1299/jsmemp.2020.28.315 ◽

2020 ◽

Vol 2020.28 (0) ◽

pp. 315

Author(s):

Xin LIANG ◽

Yoshio ARAI ◽

Wakako ARAKI ◽

Noriyasu YAMADA

Keyword(s):

Elastic Modulus ◽

Simultaneous Measurement ◽

Ultrasonic Method ◽

Laser Ultrasonic ◽

Non Destructive ◽

Measurement Of Thickness ◽

Laser Ultrasonic Method

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J0420306 Simultaneous Measurement of Thickness and Sound Velocity for Soft Materials Combining Acoustic Resonant Phenomenon and Ultrasonic Pulse-echo Method

The Proceedings of Mechanical Engineering Congress Japan ◽

10.1299/jsmemecj.2015._j0420306- ◽

2015 ◽

Vol 2015 (0) ◽

pp. _J0420306--_J0420306-

Author(s):

Hiroki YAMADA ◽

Iwao MATSUYA ◽

Takamasa SAITO ◽

Kiyoshi OHNUMA ◽

Takashi KUWAHARA ◽

...

Keyword(s):

Sound Velocity ◽

Simultaneous Measurement ◽

Soft Materials ◽

Ultrasonic Pulse ◽

Resonant Phenomenon ◽

Measurement Of Thickness ◽

Pulse Echo Method

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Simultaneous measurement of thickness and refractive index using wedge plate lateral shearing interferometry and fourier transform method

2017 6th International Conference on Computer Applications In Electrical Engineering-Recent Advances (CERA) ◽

10.1109/cera.2017.8343359 ◽

2017 ◽

Author(s):

Amit Chatterjee ◽

Jitendra Dhanotia ◽

Vimal Bhatia ◽

Reena Disawal ◽

Shashi Prakash

Keyword(s):

Refractive Index ◽

Fourier Transform ◽

Simultaneous Measurement ◽

Transform Method ◽

Fourier Transform Method ◽

Shearing Interferometry ◽

Lateral Shearing ◽

Wedge Plate ◽

Measurement Of Thickness ◽

Lateral Shearing Interferometry

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Simultaneous measurement of thickness and refractive index by a single-channel self-mixing interferometer

IET Optoelectronics ◽

10.1049/iet-opt.2011.0044 ◽

2012 ◽

Vol 6 (1) ◽

pp. 7 ◽

Author(s):

M.T. Fathi ◽

S. Donati

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Single Channel ◽

Measurement Of Thickness

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