Defect Characterization in High‐Electron‐Mobility Transistors with Regrown p‐GaN Gate by Low‐Frequency Noise and Deep Level Transient Spectroscopy

2021 ◽  
Author(s):  
Po-Chun (Brent) Hsu ◽  
Eddy Simoen ◽  
Hu Liang ◽  
Brice De Jaeger ◽  
Benoit Bakeroot ◽  
...  
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Low Frequency ◽  
High Electron Mobility Transistors ◽  
Frequency Noise ◽  
Defect Characterization ◽  
High Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors ◽  
Transient Spectroscopy

Deep level transient spectroscopy of n-AlGaAs/GaAs high electron mobility transistors

1990 ◽  
Vol 26 (3) ◽  
pp. 159 ◽  
Author(s):  
J. Goostray ◽  
H. Thomas ◽  
D.V. Morgan ◽  
E. Kohn ◽  
A. Christou ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors ◽  
Transient Spectroscopy

Low-Frequency Noise Investigation of AlGaN/GaN High-Electron-Mobility Transistors

2021 ◽  
pp. 108050
Author(s):  
Maria Glória Caño de Andrade ◽  
Luis Felipe de Oliveira Bergamim ◽  
Braz Baptista Júnior ◽  
Carlos Roberto Nogueira ◽  
Fábio Alex da Silva ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Low Frequency ◽  
High Electron Mobility Transistors ◽  
Frequency Noise ◽  
High Electron ◽  
Low Frequency Noise ◽  
High Electron Mobility ◽  
Electron Mobility Transistors

scholarly journals Excess low-frequency noise in AlGaN/GaN-based high-electron-mobility transistors

2002 ◽  
Vol 80 (12) ◽  
pp. 2126-2128 ◽  
Author(s):  
S. A. Vitusevich ◽  
S. V. Danylyuk ◽  
N. Klein ◽  
M. V. Petrychuk ◽  
V. N. Sokolov ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Low Frequency ◽  
High Electron Mobility Transistors ◽  
Frequency Noise ◽  
High Electron ◽  
Low Frequency Noise ◽  
High Electron Mobility ◽  
Electron Mobility Transistors
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