Facile fabrication of CuO nanosheets and in‐situ TEM/XRD heating Characterization of Microstructure Evolution

2022 ◽  
Author(s):  
Baoshuo Yang ◽  
Yuan Ai
Keyword(s):  
Microstructure Evolution ◽  
In Situ Tem ◽  
Facile Fabrication ◽  
Cuo Nanosheets

scholarly journals In situ TEM Characterization of Microstructure Evolution and Mechanical Behavior of the 3D-Printed Inconel 718 Exposed to High Temperature

2021 ◽  
Vol 27 (2) ◽  
pp. 250-256
Author(s):  
Supriya Koul ◽  
Le Zhou ◽  
Omar Ahmed ◽  
Yongho Sohn ◽  
Tengfei Jiang ◽  
...  
Keyword(s):  
High Temperature ◽  
Mechanical Behavior ◽  
Microstructure Evolution ◽  
Inconel 718 ◽  
In Situ Tem ◽  
Tem Characterization ◽  
3D Printed

Abstract

scholarly journals In Situ TEM Study of Microstructure Evolution of Zr-Nb-Fe Alloy Irradiated by 800 keV Kr2+ Ions

Materials ◽  
2017 ◽  
Vol 10 (4) ◽  
pp. 437
Author(s):  
◽  
◽  
◽  
◽  
◽  
...  
Keyword(s):  
Microstructure Evolution ◽  
In Situ Tem

scholarly journals In Situ TEM Characterization of Electrochemical Systems

2011 ◽  
Vol 17 (S2) ◽  
pp. 1572-1573 ◽  
Author(s):  
K Noh ◽  
L Sun ◽  
X Chen ◽  
J Wen ◽  
S Dillon
Keyword(s):  
In Situ Tem ◽  
Electrochemical Systems ◽  
Tem Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Characterization of Nanodevices by using In-Situ TEM-STM

2008 ◽  
Vol 14 (S2) ◽  
pp. 20-21 ◽  
Author(s):  
J Kim ◽  
D Cha ◽  
SY Park ◽  
MJ Kim
Keyword(s):  
New Mexico ◽  
In Situ Tem

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In situ TEM characterization of interfacial reaction in Sn–3.5Ag/electroless Ni(P) solder joint

2011 ◽  
Vol 64 (7) ◽  
pp. 597-600 ◽  
Author(s):  
Han-Byul Kang ◽  
Jee-Hwan Bae ◽  
Jeong-Won Yoon ◽  
Seung-Boo Jung ◽  
Jongwoo Park ◽  
...  
Keyword(s):  
Solder Joint ◽  
Interfacial Reaction ◽  
In Situ Tem ◽  
Tem Characterization ◽  
Electroless Ni

scholarly journals Microstructure Evolution of Sol-gel Derived Oxide Nanostructures with In-Situ TEM

2010 ◽  
Vol 16 (S2) ◽  
pp. 350-351
Author(s):  
A Yan ◽  
VP Dravid
Keyword(s):  
Microstructure Evolution ◽  
Sol Gel ◽  
In Situ Tem ◽  
Oxide Nanostructures

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

In-situ TEM mechanical characterization of nanowire in atomic scale using MEMS device

2017 ◽  
Vol 24 (4) ◽  
pp. 2045-2049 ◽  
Author(s):  
Xiao Zhang ◽  
Yang Yang ◽  
Fangfang Xu ◽  
Tie Li ◽  
Yuelin Wang
Keyword(s):  
Mechanical Characterization ◽  
Atomic Scale ◽  
In Situ Tem ◽  
Mems Device

Nanomeasurements of individual carbon nanotubes by in situ TEM

2000 ◽  
Vol 72 (1-2) ◽  
pp. 209-219 ◽  
Author(s):  
Z. L. Wang ◽  
P. Poncharal ◽  
W. A. de Heer
Keyword(s):  
Carbon Nanotubes ◽  
Complete Characterization ◽  
Atomic Scale ◽  
In Situ Tem ◽  
Mechanical And Electrical Properties ◽  
Novel Approach ◽  
Transmission Electron ◽  
Electron Field

Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechanical and electrical properties of individual nanotube-like structures by in situ transmission electron microscopy (TEM). The technique is powerful in a way that it can be directly correlated to the atomic-scale microstructure of the carbon nanotube with its physical properties, thus providing a complete characterization of the nanotube. Applications of the technique will be demonstrated in measurements of the mechanical properties, the electron field emission, and the ballistic quantum conductance of individual carbon nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f = 10-15 ).

An in-situ TEM investigation on microstructure evolution of Ni-25at.% Al thin films

2009 ◽  
Vol 478 (1-2) ◽  
pp. 240-245 ◽  
Author(s):  
P.Y. Li ◽  
H.M. Lu ◽  
S.C. Tang ◽  
X.K. Meng
Keyword(s):  
Thin Films ◽  
Microstructure Evolution ◽  
In Situ Tem
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