scholarly journals Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

2017 ◽  
Vol 254 (11) ◽  
pp. 1700176 ◽  
Author(s):  
Christian Kramberger ◽  
Andreas Mittelberger ◽  
Christoph Hofer ◽  
Jannik C. Meyer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Maximum Likelihood ◽  
Point Defects ◽  
Scanning Transmission Electron Microscopy ◽  
Low Dose ◽  
Microscopy Imaging ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

scholarly journals Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

2010 ◽  
Vol 16 (S2) ◽  
pp. 80-81 ◽  
Author(s):  
SD Findlay ◽  
N Shibata ◽  
H Sawada ◽  
E Okunishi ◽  
Y Kondo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Bright Field ◽  
Microscopy Imaging ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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