Measurement of the Al content in AlGaN epitaxial layers by combined energy-dispersive X-ray and electron energy-loss spectroscopy in a transmission electron microscope
2012 ◽
Vol 9
(3-4)
◽
pp. 1079-1082
◽
2011 ◽
Vol 94
(8)
◽
pp. 2633-2639
◽
2005 ◽
Vol 109
(1)
◽
pp. 19-23
◽
1998 ◽
Vol 108-109
◽
pp. 217-224
◽
1987 ◽
Vol 63
(6)
◽
pp. 489-493
◽
2000 ◽
Vol 07
(04)
◽
pp. 475-494
◽
2011 ◽
Vol 111
(11)
◽
pp. 1540-1546
◽