A Deep convolutional neural network with residual blocks for wafer map defect pattern recognition

Author(s):  
Fu‐Kwun Wang ◽  
Jia‐Hong Chou ◽  
Zemenu Endalamaw Amogne
Author(s):  
Neha Gautam ◽  
Soo See Chai ◽  
Jais Jose

Significant progress has made in pattern recognition technology. However, one obstacle that has not yet overcome is the recognition of words in the Brahmi script, specifically the identification of characters, compound characters, and word. This study proposes the use of the deep convolutional neural network with dropout to recognize the Brahmi words. This study also proposed a DCNN for Brahmi word recognition and a series of experiments are performed on standard Brahmi dataset. The practical operation of this method was systematically tested on accessible Brahmi image database, achieving 92.47% recognition rate by CNN with dropout respectively which is among the best while comparing with the ones reported in the literature for the same task.


2020 ◽  
Vol 2020 (4) ◽  
pp. 4-14
Author(s):  
Vladimir Budak ◽  
Ekaterina Ilyina

The article proposes the classification of lenses with different symmetrical beam angles and offers a scale as a spot-light’s palette. A collection of spotlight’s images was created and classified according to the proposed scale. The analysis of 788 pcs of existing lenses and reflectors with different LEDs and COBs carried out, and the dependence of the axial light intensity from beam angle was obtained. A transfer training of new deep convolutional neural network (CNN) based on the pre-trained GoogleNet was performed using this collection. GradCAM analysis showed that the trained network correctly identifies the features of objects. This work allows us to classify arbitrary spotlights with an accuracy of about 80 %. Thus, light designer can determine the class of spotlight and corresponding type of lens with its technical parameters using this new model based on CCN.


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