scholarly journals Thickness determination of ultra-thin films using backscattered electron spectra of a new toroidal electrostatic spectrometer

Scanning ◽  
2006 ◽  
Vol 21 (3) ◽  
pp. 197-203 ◽  
Author(s):  
F. Schlichting ◽  
D. Berger ◽  
H. Niedrig
Keyword(s):  
Thin Films ◽  
Electron Spectra ◽  
Thickness Determination ◽  
Backscattered Electron

scholarly journals New Approach for Thickness Determination of Solution-Deposited Graphene Thin Films

ACS Omega ◽  
2017 ◽  
Vol 2 (6) ◽  
pp. 2630-2638 ◽  
Author(s):  
Henri Jussila ◽  
Tom Albrow-Owen ◽  
He Yang ◽  
Guohua Hu ◽  
Sinan Aksimsek ◽  
...  
Keyword(s):  
Thin Films ◽  
New Approach ◽  
Thickness Determination

Thickness determination of SrZrO3 thin films using both X-ray reflectometry and SIMS techniques

2008 ◽  
Vol 516 (22) ◽  
pp. 7967-7973 ◽  
Author(s):  
K. Galicka-Fau ◽  
C. Legros ◽  
M. Andrieux ◽  
M. Herbst-Ghysel ◽  
I. Gallet ◽  
...  
Keyword(s):  
Thin Films ◽  
X Ray ◽  
Thickness Determination

Refractive index and thickness determination of thin-films using Lloyd’s interferometer

2003 ◽  
Vol 225 (4-6) ◽  
pp. 341-348 ◽  
Author(s):  
A.A. Hamza ◽  
M.A. Mabrouk ◽  
W.A. Ramadan ◽  
A.M. Emara
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Thickness Determination

Thickness Determination of Ultra-Thin Films on Si Substrates by EPMA

2004 ◽  
Vol 145 (1-4) ◽  
pp. 13-17 ◽  
Author(s):  
Christiani S. Campos ◽  
Marcos A. Z. Vasconcellos ◽  
Xavier Llovet ◽  
Francesc Salvat
Keyword(s):  
Thin Films ◽  
Si Substrates ◽  
Thickness Determination
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