Auger electron spectroscopy and x-ray photoelectron spectroscopy of the biocorrosion of copper by gum arabic, bacterial culture supernatant andPseudomonas atlantica expolymer

1988 ◽  
Vol 11 (6-7) ◽  
pp. 371-376 ◽  
Author(s):  
John G. Jolley ◽  
Gill G. Geesey ◽  
Michael R. Hankins ◽  
Randy B. Wright ◽  
Paul L. Wichlacz
Keyword(s):  
Auger Electron Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Culture Supernatant ◽  
Bacterial Culture ◽  
Gum Arabic ◽  
X Ray ◽  
Bacterial Culture Supernatant

Uniform Depth Profiling in X-ray Photoelectron Spectroscopy (Electron Spectroscopy for Chemical Analysis)

1978 ◽  
Vol 32 (2) ◽  
pp. 175-177 ◽  
Author(s):  
L. Bradley ◽  
Y. M. Bosworth ◽  
D. Briggs ◽  
V. A. Gibson ◽  
R. J. Oldman ◽  
...  
Keyword(s):  
Chemical Analysis ◽  
Auger Electron Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Depth Profiling ◽  
Ion Source ◽  
X Ray ◽  
Nitride Oxide ◽  
Silicon Device

The difficulties of nonuniform ion etching which hamper depth profiling by X-ray photoelectron spectroscopy (XPS) have been overcome by use of a mechanically scanned saddle-field ion source. The system and its calibration for uniformity are described, and its performance is illustrated by the depth profile of a Si3N4/SiO2/Si metal nitride oxide silicon device. This also allows the potential advantages of XPS profiling over Auger electron spectroscopy profiling to be discussed.

Sign in / Sign up

Export Citation Format

Share Document