Local compositional analysis of self-assembled GeSi/Si nanoclusters by scanning auger microscopy with nanometre lateral resolution

Author(s):  
G A Maximov ◽  
D E Nikolitchev ◽  
D O Filatov
1988 ◽  
Vol 11 (5) ◽  
pp. 251-265 ◽  
Author(s):  
M. M. El Gomati ◽  
M. Prutton ◽  
B. Lamb ◽  
C. G. Tuppen

1982 ◽  
Vol 127 (1) ◽  
pp. 105-118 ◽  
Author(s):  
M. Prutton ◽  
D. C. Peacock

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