Electrochemistry of Thin Films with In Situ/Operando Grazing Incidence X‐Ray Scattering: Bypassing Electrolyte Scattering for High Fidelity Time Resolved Studies

Small ◽  
2021 ◽  
pp. 2103213
Author(s):  
Bryan D. Paulsen ◽  
Alexander Giovannitti ◽  
Ruiheng Wu ◽  
Joseph Strzalka ◽  
Qingteng Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
High Fidelity ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In-Situ Grazing Incidence Small-Angle X-ray Scattering Studies on Nanopore Evolution in Low-kOrganosilicate Dielectric Thin Films

2005 ◽  
Vol 38 (8) ◽  
pp. 3395-3405 ◽  
Author(s):  
Byeongdu Lee ◽  
Jinhwan Yoon ◽  
Weontae Oh ◽  
Yongtaek Hwang ◽  
Kyuyoung Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films

2017 ◽  
Vol 88 (6) ◽  
pp. 066101 ◽  
Author(s):  
Stephan Pröller ◽  
Daniel Moseguí González ◽  
Chenhuii Zhu ◽  
Eric Schaible ◽  
Cheng Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Thin Films: Sub-Micrometer Structure Formation during Spin Coating Revealed by Time-Resolved In Situ Laser and X-Ray Scattering (Adv. Funct. Mater. 46/2017)

2017 ◽  
Vol 27 (46) ◽  
Author(s):  
Jacobus J. van Franeker ◽  
Daniel Hermida-Merino ◽  
Cedric Gommes ◽  
Kirill Arapov ◽  
Jasper J. Michels ◽  
...  
Keyword(s):  
Thin Films ◽  
Structure Formation ◽  
Spin Coating ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Grazing Incidence Small Angle X-Ray Scattering as a Tool for In- Situ Time-Resolved Studies

10.5772/64877 ◽  
2017 ◽  
Author(s):  
Gonzalo Santoro ◽  
Shun Yu
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In situ Time-Resolved Small-Angle X-ray Scattering Reveals the Formation Kinetics of Polyelectrolyte Complex Micelles

2019 ◽  
Author(s):  
Hao Wu ◽  
Jeffrey Ting ◽  
Siqi Meng ◽  
Matthew Tirrell
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Electrostatic Interactions ◽  
Polyelectrolyte Complex ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

We have directly observed the <i>in situ</i> self-assembly kinetics of polyelectrolyte complex (PEC) micelles by synchrotron time-resolved small-angle X-ray scattering, equipped with a stopped-flow device that provides millisecond temporal resolution. This work has elucidated one general kinetic pathway for the process of PEC micelle formation, which provides useful physical insights for increasing our fundamental understanding of complexation and self-assembly dynamics driven by electrostatic interactions that occur on ultrafast timescales.

Time-Resolved, in Situ, Small- and Wide-Angle X-ray Scattering To Monitor Pt Nanoparticle Structure Evolution Stabilized by Adsorbed SnCl3– Ligands During Synthesis

2013 ◽  
Vol 117 (15) ◽  
pp. 7924-7933 ◽  
Author(s):  
Samuel St. John ◽  
Naiping Hu ◽  
Dale W. Schaefer ◽  
Anastasios P. Angelopoulos
Keyword(s):  
Structure Evolution ◽  
Wide Angle ◽  
Pt Nanoparticle ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Nanoparticle Structure ◽  
Ray Scattering

scholarly journals In situ investigation of annealing effect on lamellar stacking structure of polyethylene thin films by synchrotron grazing-incidence small-angle and wide-angle X-ray scattering

2007 ◽  
Vol 40 (s1) ◽  
pp. s642-s644 ◽  
Author(s):  
Sono Sasaki ◽  
Hiroyasu Masunaga ◽  
Hiroo Tajiri ◽  
Katsuaki Inoue ◽  
Hiroshi Okuda ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Annealing Effect ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
In Situ Investigation ◽  
Stacking Structure

An instrument for time-resolved and anomalous simultaneous small- and wide-angle X-ray scattering (SWAXS) at NSRRC

2006 ◽  
Vol 39 (6) ◽  
pp. 871-877 ◽  
Author(s):  
Ying-Huang Lai ◽  
Ya-Sen Sun ◽  
U-Ser Jeng ◽  
Jhih-Min Lin ◽  
Tsang-Lang Lin ◽  
...  
Keyword(s):  
Lipid Membrane ◽  
Quantum Wires ◽  
Grazing Incidence ◽  
Anomalous Scattering ◽  
Wide Angle ◽  
Scanning Calorimetry ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A SWAXS (small- and wide-angle X-ray scattering) instrument was recently installed at the wiggler beamline BL17B3 of the National Synchrotron Radiation Research Center (NSRRC), Taiwan. The instrument, which is designed for studies of static and dynamic nanostructures and correlations between the nano (ormeso) structure (SAXS) and crystalline structure (WAXS), provides a flux of 1010–1011photon s−1at the sample at energies between 5 and 14 keV. With a SAXS area detector and a WAXS linear detector connected to two data acquisition systems operated in master–slave mode, the instrument allows one to perform time-resolved as well as anomalous scattering measurements. Data reduction algorithms have been developed for rapid processing of the large SWAXS data sets collected during time-resolved measurements. The performance of the instrument is illustrated by examples taken from different classes of ongoing projects: (i) time-resolved SAXS/WAXS/differential scanning calorimetry (DSC) with a time resolution of 10 s on a semicrystalline poly(hexamethylene terephthalate) sample, (ii) anomalous SAXS/WAXS measurements on a nanoparticulate PtRu catalyst, and (iii) grazing-incidence SAXS of a monolayer of oriented semiconductor quantum wires, and humidity-controlled ordering of Alamethicin peptides embedded in an oriented lipid membrane.

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