Modeling of Physical Failure in Microwave and Optical Components For Assessment of System Risk

Preparation of Thin Cadmium Telluride Samples for Electron Microscope Studies

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100052754 ◽

1974 ◽

Vol 32 ◽

pp. 548-549

Author(s):

T. J. Magee ◽

J. Peng ◽

J. Bean

Keyword(s):

Electron Microscope ◽

Sulfuric Acid ◽

Solid State ◽

Sample Preparation ◽

Cadmium Telluride ◽

Potassium Dichromate ◽

Optical Components ◽

The Past ◽

Solid State Devices

Cadmium telluride has become increasingly important in a number of technological applications, particularly in the area of laser-optical components and solid state devices, Microstructural characterizations of the material have in the past been somewhat limited because of the lack of suitable sample preparation and thinning techniques. Utilizing a modified jet thinning apparatus and a potassium dichromate-sulfuric acid thinning solution, a procedure has now been developed for obtaining thin contamination-free samples for TEM examination.

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Self-Assembly Optical Components

MRS Proceedings ◽

10.1557/proc-771-10.10 ◽

2003 ◽

Vol 771 ◽

Cited By ~ 2

Author(s):

Pavel I. Lazarev ◽

Michael V. Paukshto ◽

Elena N. Sidorenko

Keyword(s):

Optical Properties ◽

Self Assembly ◽

Crystalline State ◽

Liquid Crystalline ◽

Film Deposition ◽

X Ray Diffraction ◽

Optical Components ◽

Crystal Film ◽

Solid Film ◽

Thin Crystal

AbstractWe report a new method of Thin Crystal Film deposition. In the present paper we describe the method of crystallization, structure, and optical properties of Bisbenzimidazo[2,1-a:1',2',b']anthra[2,1,9-def:6,5,10-d'e'f']-diisoquinoline-6,9-dion (mixture with cis-isomer) (abbreviated DBI PTCA) sulfonation product. The Thin Crystal Film has a thickness of 200-1000 nm, with anisotropic optical properties such as refraction and absorption indices. X-ray diffraction data evidences a lyotropic liquid crystalline state in liquid phase and crystalline state in solid film. Anisotropic optical properties of the film make it useful in optical devices, e.g. liquid crystal displays.

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FORMALIZED DESCRIPTION OF THE PROCEDURE OF INFORMATION SYSTEM RISK MANAGEMENT

VESTNIK OF ASTRAKHAN STATE TECHNICAL UNIVERSITY SERIES MANAGEMENT COMPUTER SCIENCE AND INFORMATICS ◽

10.24143/2072-9502-2018-2-61-70 ◽

2018 ◽

pp. 61-70

Author(s):

Svetlana Sergeevna Kozunova ◽

Alla Grigorievna Kravets

Keyword(s):

Information System ◽

Risk Management ◽

Negative Consequences ◽

Management Procedure ◽

System Risk ◽

Weak Points ◽

Formalized Description ◽

Relationship Of ◽

The Relationship ◽

Further Development

The article highlights the aspects of risk management in the information system. According to the analysis of the work of Russian and foreign scientists and world practices in the field of risk management, it is stated that there is a need to improve the effectiveness of risk management of information system and to develop a method for managing the risks of the information system. As a solution to the problem of effective risk management of the information system, there has been proposed a formalized procedure for managing the risks of the information system. The scientific novelty of this solution is the use of decision space and optimization space to reduce risks. This procedure allows to assess the damage, risk and effectiveness of risk management of the information system. The risks of the information system are determined and analyzed; a pyramidal risk diagram is developed. This diagram allows you to describe the relationship of risks with the components of the information system. The negative consequences to which these risks can lead are given. The analysis of methods and approaches to risk management has been carried out. Based on the results of the analysis, the methods GRAMM, CORAS, GOST R ISO / IEC scored to the maximum. The weak points of these methods and the difficulty of applying these methods in practice are described. The developed formalized risk management procedure to control the risks of information system can be used as management system’s element of the information security quality that complies with the recommendations of GOST R ISO / IEC 27003-2012. The prospect of further development of the research results is the development of management systems of risk of information system.

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