Abstract
This paper investigates the interaction behaviour between the fundamental shear horizontal guided wave mode and small defects, in order to understand and develop an improved inspection system for titanium samples. In this work, an extensive range of defect sizes have been simulated using finite element software. The SH0 reflection from a defect has been shown previously to depend on its length as the total reflection consists of reflections from both the front and back face. However, for small defect widths, this work has found that the width also affects this interference, changing the length at which the reflection is largest. In addition, the paper looks at how the size of the defect affects the mode converted S0 reflection and SH0 diffraction. The relationship between the SH0 diffraction and defect size is shown to be more complex compared to the reflections. The mode converted S0 reflection occurs at an angle to the incident wave direction; therefore, the most suitable angle for the detection has been found. Simultaneous measurement of multiple waves would bring benefits to inspection.
Guided Wave Mode Propagation Influence for a Shear Horizontal Wave Source in An Anisotropic Viscoelastic Layer