A miniaturized contactless pure-bending device for in-situ SEM failure analysis

2011 ◽  
pp. 587-596
Author(s):  
J. P. M. Hoefnagels ◽  
C. A. Buizer ◽  
M. G. D. Geers
Keyword(s):  
Failure Analysis ◽  
Pure Bending

In Situ Removal of Polyimide Layer Using Modified Decapsulator

2009 ◽  
Author(s):  
C. Ramachandra ◽  
B.M. Sweety ◽  
U.G. Chandan ◽  
D. Jaypal ◽  
Sarat Kumar Dash ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Analysis Techniques ◽  
Alternative Method ◽  
Ic Package ◽  
Polyimide Layer

Abstract Removal of polyimide layer after decapsulation of IC package is essential for many of the failure analysis techniques. An alternative method for polyimide removal is described in this paper. The method suggests appropriate modification of dual acid decapsulation system for this purpose. Device integrity is verified after removal of polyimide layer. This method becomes promising for devices which are sensitive / vulnerable for exposure to plasma.

In situ investigations and failure analysis of the rainwater pumps installed in a wastewater treatment plant

2019 ◽  
Vol 109 (S1) ◽  
pp. 42-47
Author(s):  
Sebastian Muntean ◽  
Liviu Marşavina ◽  
Alexandru Hedeş ◽  
Liviu Eugen Anton ◽  
Ilie Vlaicu
Keyword(s):  
Wastewater Treatment ◽  
Failure Analysis ◽  
Wastewater Treatment Plant ◽  
Treatment Plant

In-situ failure analysis of a Ni coating deposited by electrolyte brushing

1995 ◽  
Vol 76-77 ◽  
pp. 132-134
Author(s):  
I.C. Grigorescu ◽  
G. Navas
Keyword(s):  
Failure Analysis

scholarly journals A Small-Scale, Contactless, Pure Bending Device for In-situ Testing

2015 ◽  
Vol 55 (8) ◽  
pp. 1511-1524 ◽  
Author(s):  
J.P.M. Hoefnagels ◽  
A.P. Ruybalid ◽  
C.A. Buizer
Keyword(s):  
Small Scale ◽  
In Situ Testing ◽  
Pure Bending

Failure Analysis of Mechanical Systems Based on Function-Cum-Structure Approach

2006 ◽  
Author(s):  
M. F. Wani
Keyword(s):  
Failure Analysis ◽  
Mechanical Systems ◽  
Sliding Contact ◽  
System Function ◽  
Operational Parameters ◽  
Structure Approach ◽  
Critical Function ◽  
Failure Function ◽  
Structure Graph

This paper suggest failure analysis of mechanical systems using function cum structure approach. Operational parameters of system function are identified and their relationships are developed. The predicates, which comprise the components of the system and their properties as their attributes, i.e., type of connectivity (fixed or sliding contact) and functions (transmit torque, and transmit force etc.) represent the facts. The facts are modelled in terms of functional-cum-structure graph. By analysing interaction of a failure function i.e., function of a failed component in the graph with other functions, the failure cause-function is identified. The problem can either be solved by removing the cause-functions or by modifying the failure function. A critical function is also identified from function set on the basis of importance of a function. Appropriate parameters for in-situ design provision for condition monitoring of the system are also identified. The steps of the methodology are included and are illustrated by means of an example.

Determination of cross-sectional area of natural plant fibres and fibre failure analysis by in situ SEM observation during microtensile tests

Cellulose ◽  
2019 ◽  
Vol 26 (8) ◽  
pp. 4693-4706 ◽  
Author(s):  
Hangbo Yue ◽  
Juan C. Rubalcaba ◽  
Yingde Cui ◽  
Juan P. Fernández-Blázquez ◽  
Chufen Yang ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Cross Sectional Area ◽  
Sectional Area ◽  
Cross Sectional ◽  
Natural Plant ◽  
Fibre Failure ◽  
Sem Observation

In-situ Characterization of Switching Mechanism in Phase Change Random Access Memory (PRAM) Using Transmission Electron Microscopy (TEM)

2013 ◽  
Author(s):  
Sungkyu Son ◽  
Seungjoon Jeon ◽  
Jangwon Oh ◽  
Won Kim ◽  
Hojoung Kim ◽  
...  
Keyword(s):  
Phase Transition ◽  
Failure Analysis ◽  
Phase Change ◽  
Void Formation ◽  
Amorphous State ◽  
Random Access ◽  
Switching Behavior ◽  
In Situ Tem ◽  
Switching Mechanism

Abstract It is important to understand the switching mechanism of phase change material for failure analysis of PRAM device. In this study, the real time observations of phase transition and void formation mechanism of confined GST structure were investigated using in-situ TEM with multi-pulse AC biasing technique. In-situ SET switching behavior between amorphous state and crystalline state with continuous structural change was successfully observed. Volume shrink of GST, due to the phase transition, induced voids at grain boundary of crystalline phase. Excess Joule-heating after crystallization caused coalescence and migration of voids. These results may give us a crucial clue for endurance failure analysis of PRAM.

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