77Se NMR observation and Monte-Carlo simulation of the Li+ ion distribution in lithium intercalated titanium diselenide

Author(s):  
Yves Chabre ◽  
Philippe Deniard
1994 ◽  
Vol 12 (10/11) ◽  
pp. 1076-1084 ◽  
Author(s):  
I. A. Barghouthi ◽  
A. R. Barakat ◽  
R. W. Schunk

Abstract. Non-Maxwellian ion velocity distribution functions have been theoretically predicted and confirmed by observations, to occur at high latitudes. These distributions deviate from Maxwellian due to the combined effect of the E×B drift and ion-neutral collisions. The majority of previous literature, in which the effect of ion self-collisions was neglected, established a clear picture for the ion distribution under a wide range of conditions. At high altitudes and/or for solar maximum conditions, the ion-to-neutral density ratio increases and, hence, the role of ion self-collisions becomes appreciable. A Monte Carlo simulation was used to investigate the behaviour of O+ ions that are E×B-drifting through a background of neutral O, with the effect of O+ (Coulomb) self-collisions included. Wide ranges of the ion-to-neutral density ratio ni/nn and the electrostatic field E were considered in order to investigate the change of ion behaviour with solar cycle and with altitude. For low altitudes and/or solar minimum (ni/nn≤ 10-5), the effect of self-collisions is negligible. For higher values of ni/nn, the effect of self-collisions becomes significant and, hence, the non-Maxwellian features of the O+ distribution are reduced. For example, the parallel temperature Ti\\Vert increases, the perpendicular temperature Ti⊥ decreases, the temperature anisotropy approaches unity and the toroidal features of the ion distribution function become less pronounced. Also, as E increases, the ion-neutral collision rate increases, while the ion-ion collision rate decreases. Therefore, the effect of ion self-collisions is reduced. Finally, the Monte Carlo results were compared to those that used simplified collision models in order to assess their validity. In general, the simple collision models tend to be more accurate for low E and for high ni/nn.


Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.


Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.


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