Transmission Electron Microscopy Imaging to Analyze Chromatin Density Distribution at the Nanoscale Level

2017 ◽  
pp. 633-651 ◽  
Author(s):  
Tohnyui Ndinyanka Fabrice ◽  
Lusik Cherkezyan ◽  
Christoph Ringli ◽  
Célia Baroux
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Density Distribution ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
Chromatin Density ◽  
Nanoscale Level

scholarly journals Fabrication of a liquid cell for in situ transmission electron microscopy

Microscopy ◽  
2020 ◽  
Author(s):  
Xiaoguang Li ◽  
Kazutaka Mitsuishi ◽  
Masaki Takeguchi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cost Effective ◽  
Production Method ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Liquid Cell ◽  
Si Wafer

Abstract Liquid cell transmission electron microscopy (LCTEM) enables imaging of dynamic processes in liquid with high spatial and temporal resolution. The widely used liquid cell (LC) consists of two stacking microchips with a thin wet sample sandwiched between them. The vertically overlapped electron-transparent membrane windows on the microchips provide passage for the electron beam. However, microchips with imprecise dimensions usually cause poor alignment of the windows and difficulty in acquiring high-quality images. In this study, we developed a new and efficient microchip fabrication process for LCTEM with a large viewing area (180 µm × 40 µm) and evaluated the resultant LC. The new positioning reference marks on the surface of the Si wafer dramatically improve the precision of dicing the wafer, making it possible to accurately align the windows on two stacking microchips. The precise alignment led to a liquid thickness of 125.6 nm close to the edge of the viewing area. The performance of our LC was demonstrated by in situ transmission electron microscopy imaging of the dynamic motions of 2-nm Pt particles. This versatile and cost-effective microchip production method can be used to fabricate other types of microchips for in situ electron microscopy.

scholarly journals Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

2010 ◽  
Vol 16 (S2) ◽  
pp. 80-81 ◽  
Author(s):  
SD Findlay ◽  
N Shibata ◽  
H Sawada ◽  
E Okunishi ◽  
Y Kondo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Bright Field ◽  
Microscopy Imaging ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Determination of surface crystallography of faceted nanoparticles using transmission electron microscopy imaging and diffraction modes

2009 ◽  
Vol 42 (3) ◽  
pp. 519-524 ◽  
Author(s):  
Song Li ◽  
Yudong Zhang ◽  
Claude Esling ◽  
Jacques Muller ◽  
Jean-Sébastien Lecomte ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Coordinate System ◽  
Calculation Method ◽  
Microscopy Imaging ◽  
Plane Normal ◽  
Transmission Electron ◽  
Structure Of Nanoparticles ◽  
Normal Vectors

A general calculation method is proposed to characterize the crystalline planes and directions of a faceted nanoparticle using transmission electron microscopy (TEM) imaging and diffraction modes. With the determination of the edge vectors and then the plane normal vectors in the screen coordinate system of TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. The method is helpful for related studies of the determination of the surface structure of nanoparticles.

Transmission Electron Microscopy Imaging of Structural Transformation Dynamics in a Single Nanocrystal

2012 ◽  
Vol 20 (1) ◽  
pp. 18-22
Author(s):  
Haimei Zheng
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Collection Efficiency ◽  
Single Atom ◽  
Microscopy Imaging ◽  
High Brightness ◽  
Rapid Acquisition ◽  
Signal Collection ◽  
Transmission Electron ◽  
Resolution Imaging

Over the last decade, transmission electron microscopy (TEM) has advanced remarkably. With the development of aberration-corrected optics, improved recording systems, high brightness guns, and so on, imaging with single-atom sensitivity across the periodic table has become a reality. Atomic resolution imaging with rapid acquisition and with greater signal collection efficiency opens many opportunities in the study of dynamic processes of materials.

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