Low-Latency Guarantee Protocol Based on Multi-links Scheduling Random Access in the Next Generation WLAN: IEEE 802.11be

Author(s):  
Luoting Gan ◽  
Bo Li ◽  
Mao Yang ◽  
Zhongjiang Yan
2019 ◽  
Vol 24 (5) ◽  
pp. 1425-1436
Author(s):  
Run Zhou ◽  
Bo Li ◽  
Mao Yang ◽  
Zhongjiang Yan ◽  
Annan Yang

ICT Express ◽  
2021 ◽  
Vol 7 (1) ◽  
pp. 41-48
Author(s):  
Eunkyung Kim ◽  
Heesoo Lee

2017 ◽  
Vol 898 ◽  
pp. 082045 ◽  
Author(s):  
R Ammendola ◽  
A Biagioni ◽  
P Cretaro ◽  
O Frezza ◽  
F Lo Cicero ◽  
...  

2016 ◽  
Vol 06 (02) ◽  
pp. 1630003 ◽  
Author(s):  
Zhen Fan ◽  
Jingsheng Chen ◽  
John Wang

Ferroelectric random access memory (FeRAM) based on conventional ferroelectric perovskites, such as Pb(Zr,Ti)O3 and SrBi2Ta2O9, has encountered bottlenecks on memory density and cost, because those conventional perovskites suffer from various issues mainly including poor complementary metal-oxide-semiconductor (CMOS)-compatibility and limited scalability. Next-generation cost-efficient, high-density FeRAM shall therefore rely on a material revolution. Since the discovery of ferroelectricity in Si:HfO2 thin films in 2011, HfO2-based materials have aroused widespread interest in the field of FeRAM, because they are CMOS-compatible and can exhibit robust ferroelectricity even when the film thickness is scaled down to below 10 nm. A review on this new class of ferroelectric materials is therefore of great interest. In this paper, the most appealing topics about ferroelectric HfO2-based materials including origins of ferroelectricity, advantageous material properties, and current and potential applications in FeRAM, are briefly reviewed.


2017 ◽  
Vol 25 (2) ◽  
pp. 471-485 ◽  
Author(s):  
Yongping Zhang ◽  
Bo Li ◽  
Mao Yang ◽  
Zhongjiang Yan ◽  
Xiaoya Zuo

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