An Ion Source for Obtaining Highly Stripped Heavy Ions

1975 ◽  
pp. 397-400 ◽  
Author(s):  
A. Jain ◽  
A. S. Divatia
Keyword(s):  
Heavy Ions ◽  
Ion Source

Effect of Electrode for Producing the Highly Charged Heavy Ions from RIKEN 18 GHz Electron Cyclotron Resonance Ion Source

1999 ◽  
Vol 38 (Part 1, No. 6A) ◽  
pp. 3707-3711
Author(s):  
Tetsuro Kurita ◽  
Takahide Nakagawa ◽  
Masanori Kidera ◽  
Yoshitoshi Miyazawa ◽  
Masatake Hemmi ◽  
...  
Keyword(s):  
Cyclotron Resonance ◽  
Heavy Ions ◽  
Electron Cyclotron Resonance ◽  
Ion Source ◽  
Electron Cyclotron

scholarly journals C60 ions of 1 MeV are slow but elongate nanoparticles like swift heavy ions of hundreds MeV

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
H. Amekura ◽  
K. Narumi ◽  
A. Chiba ◽  
Y. Hirano ◽  
K. Yamada ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Ion Source ◽  
Synergy Effect ◽  
Irradiation Effects ◽  
Nuclear Collisions ◽  
Ion Tracks ◽  
Swift Heavy Ions ◽  
New Type ◽  
Molecule Model ◽  
Track Diameter

Abstract This study reports that high fluence fullerene ion (C60+) irradiation of 1–6 MeV, which was made possible by a new-type of high-flux ion source, elongates metal nanoparticles (NPs) in amorphous SiO2 as efficiently as swift heavy ions (SHIs) of 200 MeV Xe14+, i.e., two orders of the magnitude higher energy ions. Comparing the irradiation effects induced by both the beams, the stopping processes of C60 ions in SiO2 are discussed in this paper. Despite of having almost the same elongation efficiency, the C60+ irradiation induced ~10 times more efficient sputtering due to the clustering enhancement and/or the synergy effect. Ion tracks of ~10.4 nm in diameter and 60–80 nm in length were observed in crystalline SiO2 under 4 MeV C60 irradiation. While the track diameter was comparable to those by SHIs of the same electronic stopping, much shorter track lengths than those predicted by a rigid C60 molecule model indicates that the fragmentation occurred due to nuclear collisions. The elongation of the metal NPs was induced only down to the depth where the tracks were observed but not beyond.

An Ion Source for Negative Heavy Ions

1969 ◽  
Vol 16 (3) ◽  
pp. 38-40 ◽  
Author(s):  
M. Mueller ◽  
G. Hortig
Keyword(s):  
Heavy Ions ◽  
Ion Source

An electron beam ion source for the production of multiply charged heavy ions

1975 ◽  
Vol 128 (1) ◽  
pp. 1-7 ◽  
Author(s):  
G. Clausnitzer ◽  
H. Klinger ◽  
A. Müller ◽  
E. Salzborn
Keyword(s):  
Electron Beam ◽  
Heavy Ions ◽  
Ion Source ◽  
Multiply Charged

scholarly journals Ion Source for the Production of Multiply Charged Heavy Ions

1956 ◽  
Vol 27 (10) ◽  
pp. 809-817 ◽  
Author(s):  
Carl E. Anderson ◽  
Kenneth W. Ehlers
Keyword(s):  
Heavy Ions ◽  
Ion Source ◽  
Multiply Charged

scholarly journals High-current laser ion source based on a low-power laser

2003 ◽  
Vol 21 (4) ◽  
pp. 633-638 ◽  
Author(s):  
M. OGAWA ◽  
M. YOSHIDA ◽  
M. NAKAJIMA ◽  
J. HASEGAWA ◽  
S. FUKATA ◽  
...  
Keyword(s):  
Low Power ◽  
Heavy Ions ◽  
Low Voltage ◽  
High Voltage Pulse ◽  
Ion Source ◽  
Laser Ion Source ◽  
Power Laser ◽  
Nd:Yag Lasers ◽  
Single Probe ◽  
Pulse Extraction

An ion source for generation of low-charged heavy ions has been developed using low-power KrF excimer and frequency-doubled Nd:YAG lasers. The ion source was examined with two experimental modes of low-voltage DC extraction at ∼20 kV and high-voltage pulse extraction at 150 kV. Normalized emittance of extracted beams composed of Cu+ and Cu2+ ions was measured to be about 0.05 and 0.8 πmm-mrad for the DC extraction and the pulse extraction, respectively. Electron temperature was observed by means of a single probe method to be 0.8 to 2.5 eV, depending on the intensity of the KrF laser.

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