SDI4Apps Points of Interest Knowledge Base

Enterprise System in the German Manufacturing Mittelstand

Enterprise Information Systems ◽

10.4018/978-1-61692-852-0.ch809 ◽

2011 ◽

pp. 1924-1940

Author(s):

Tobias Schoenherr ◽

Ditmar Hilpert ◽

Ashok K. Soni ◽

M.A. Venkataramanan ◽

Vincent A. Mabert

Keyword(s):

United States ◽

Knowledge Base ◽

Manufacturing Sector ◽

German Economy ◽

Enterprise Systems ◽

The United States ◽

Enterprise System ◽

Crucial Importance ◽

Points Of Interest

Although the research on integrated enterprise systems (ES) is proliferating, the knowledge base about ES implementations, usage and experiences outside the United States is still small. This is also true for Germany, despite the crucial importance of ES in the country, and the potential uniqueness of its ES environment. Most ES research to date has also been focusing on larger corporations, neglecting the challenges and issues that small and medium sized enterprises (SMEs) have been experiencing. Collectively often referred to as the Mittelstand, German SMEs form the backbone of the German economy. This chapter brings attention to these areas by describing observations obtained from eight SMEs in the German manufacturing sector. These findings about ES implementation, usage, and experiences are reported and summarized along nine points of interest.

Download Full-text

Enterprise System in the German Manufacturing Mittelstand

Handbook of Research on Enterprise Systems ◽

10.4018/978-1-59904-859-8.ch015 ◽

2009 ◽

pp. 201-217

Author(s):

Tobias Schoenherr ◽

Ditmar Hilpert ◽

Ashok K. Soni ◽

M.A. Venkataramanan ◽

Vincent A. Mabert

Keyword(s):

United States ◽

Knowledge Base ◽

Manufacturing Sector ◽

German Economy ◽

Enterprise Systems ◽

The United States ◽

Enterprise System ◽

Crucial Importance ◽

Points Of Interest

Although the research on integrated enterprise systems (ES) is proliferating, the knowledge base about ES implementations, usage and experiences outside the United States is still small. This is also true for Germany, despite the crucial importance of ES in the country, and the potential uniqueness of its ES environment. Most ES research to date has also been focusing on larger corporations, neglecting the challenges and issues that small and medium sized enterprises (SMEs) have been experiencing. Collectively often referred to as the Mittelstand, German SMEs form the backbone of the German economy. This chapter brings attention to these areas by describing observations obtained from eight SMEs in the German manufacturing sector. These findings about ES implementation, usage, and experiences are reported and summarized along nine points of interest.

Download Full-text

Theory and Errors in Stereo Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101426 ◽

1968 ◽

Vol 26 ◽

pp. 336-337

Author(s):

J. M. Pankratz

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Plane Wave ◽

Focal Length ◽

Foil Thickness ◽

Points Of Interest ◽

Transmission Electron ◽

Vertical Spacing ◽

Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

Download Full-text

Small Computer System for Micrograph Analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100097879 ◽

1981 ◽

Vol 39 ◽

pp. 270-271

Author(s):

J. F. Hainfeld ◽

J. S. Wall

Keyword(s):

Large Range ◽

Small Computer ◽

Black And White ◽

Contour Maps ◽

Points Of Interest ◽

Computer Aided Analysis ◽

Specialized Hardware ◽

Additional Memory ◽

Selection Of ◽

Publication Quality

Cost reduction and availability of specialized hardware for image processing have made it reasonable to purchase a stand-alone interactive work station for computer aided analysis of micrographs. Some features of such a system are: 1) Ease of selection of points of interest on the micrograph. A cursor can be quickly positioned and coordinates entered with a switch. 2) The image can be nondestructively zoomed to a higher magnification for closer examination and roaming (panning) can be done around the picture. 3) Contrast and brightness of the picture can be varied over a very large range by changing the display look-up tables. 4) Marking items of interest can be done by drawing circles, vectors or alphanumerics on an additional memory plane so that the picture data remains intact. 5) Color pictures can easily be produced. Since the human eye can detect many more colors than gray levels, often a color encoded micrograph reveals many features not readily apparent with a black and white display. Colors can be used to construct contour maps of objects of interest. 6) Publication quality prints can easily be produced by taking pictures with a standard camera of the T.V. monitor screen.

Download Full-text