scholarly journals No Free Charge Theorem: A Covert Channel via USB Charging Cable on Mobile Devices

Author(s):  
Riccardo Spolaor ◽  
Laila Abudahi ◽  
Veelasha Moonsamy ◽  
Mauro Conti ◽  
Radha Poovendran
2018 ◽  
Vol 22 (1) ◽  
pp. 31-34 ◽  
Author(s):  
Zhice Yang ◽  
Qianyi Huang ◽  
Qian Zhang

2018 ◽  
Vol 2018 (4) ◽  
pp. 141-158 ◽  
Author(s):  
Pavel Lifshits ◽  
Roni Forte ◽  
Yedid Hoshen ◽  
Matt Halpern ◽  
Manuel Philipose ◽  
...  

Abstract Mobile devices are equipped with increasingly smart batteries designed to provide responsiveness and extended lifetime. However, such smart batteries may present a threat to users’ privacy. We demonstrate that the phone’s power trace sampled from the battery at 1KHz holds enough information to recover a variety of sensitive information. We show techniques to infer characters typed on a touchscreen; to accurately recover browsing history in an open-world setup; and to reliably detect incoming calls, and the photo shots including their lighting conditions. Combined with a novel exfiltration technique that establishes a covert channel from the battery to a remote server via a web browser, these attacks turn the malicious battery into a stealthy surveillance device. We deconstruct the attack by analyzing its robustness to sampling rate and execution conditions. To find mitigations we identify the sources of the information leakage exploited by the attack. We discover that the GPU or DRAM power traces alone are sufficient to distinguish between different websites. However, the CPU and power-hungry peripherals such as a touchscreen are the primary sources of fine-grain information leakage. We consider and evaluate possible mitigation mechanisms, highlighting the challenges to defend against the attacks. In summary, our work shows the feasibility of the malicious battery and motivates further research into system and application-level defenses to fully mitigate this emerging threat.


2012 ◽  
Vol 2 (3) ◽  
pp. 86-88
Author(s):  
Dr. Kuntal Patel ◽  
◽  
Prof. Parimal Patel
Keyword(s):  

2002 ◽  
Vol 719 ◽  
Author(s):  
Galina Khlyap

AbstractRoom-temperature electric investigations carried out in CO2-laser irradiated ZnCdHgTe epifilms revealed current-voltage and capacitance-voltage dependencies typical for the metal-semiconductor barrier structure. The epilayer surface studies had demonstrated that the cell-like relief has replaced the initial tessellated structure observed on the as-grown samples. The detailed numerical analysis of the experimental measurements and morphological investigations of the film surface showed that the boundaries of the cells formed under the laser irradiation are appeared as the regions of accumulation of derived charged defects of different type of conductivity supplying free charge carriers under the applied electric field.


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