Design of Electronic Circuits Using a Divide-and-Conquer Approach

2007 ◽  
pp. 13-22
Author(s):  
Guoliang He ◽  
Yuanxiang Li ◽  
Li Yu ◽  
Wei Zhang ◽  
Hang Tu
Keyword(s):  
Divide And Conquer ◽  
Electronic Circuits

Interactions Between Al and Cr Thin Films

1976 ◽  
Vol 34 ◽  
pp. 638-639
Author(s):  
R. M. Anderson ◽  
T. M. Reith ◽  
M. J. Sullivan ◽  
E. K. Brandis
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Vacuum System ◽  
Processing Temperature ◽  
Diffusion Couples ◽  
Electronic Circuits ◽  
Intermetallic Formation ◽  
Si Substrates ◽  
Aluminum Silicon

Thin films of aluminum or aluminum-silicon can be used in conjunction with thin films of chromium in integrated electronic circuits. For some applications, these films exhibit undesirable reactions; in particular, intermetallic formation below 500 C must be inhibited or prevented. The Al films, being the principal current carriers in interconnective metal applications, are usually much thicker than the Cr; so one might expect Al-rich intermetallics to form when the processing temperature goes out of control. Unfortunately, the JCPDS and the literature do not contain enough data on the Al-rich phases CrAl7 and Cr2Al11, and the determination of these data was a secondary aim of this work.To define a matrix of Cr-Al diffusion couples, Cr-Al films were deposited with two sets of variables: Al or Al-Si, and broken vacuum or single pumpdown. All films were deposited on 2-1/4-inch thermally oxidized Si substrates. A 500-Å layer of Cr was deposited at 120 Å/min on substrates at room temperature, in a vacuum system that had been pumped to 2 x 10-6 Torr. Then, with or without vacuum break, a 1000-Å layer of Al or Al-Si was deposited at 35 Å/s, with the substrates still at room temperature.

Protection of Electronic Circuits from Overvoltages

1991 ◽  
Vol 5 (1) ◽  
pp. 4 ◽  
Author(s):  
A.T. Johns
Keyword(s):  
Electronic Circuits

Scaffold Safety Analysis: Focusing on Divide-and-Conquer Method

2020 ◽  
Author(s):  
Sayan Sakhakarmi ◽  
Chunhee Cho ◽  
JeeWoong Park
Keyword(s):  
Safety Analysis ◽  
Divide And Conquer

DIAGNOSING COMPLEX ELECTRONIC CIRCUITS BASED ON THE METHOD OF TRAINING AND TESTING CHARACTERISTICS

2015 ◽  
Vol 19 (95) ◽  
pp. 272-275 ◽  
Author(s):  
Jo. Sterten ◽  
◽  
Andrej A. Verlan
Keyword(s):  
Electronic Circuits

Discontinuous Control and Stability Analysis of Step-Down DC-DC Voltage Converters

2020 ◽  
Vol 38 (3A) ◽  
pp. 446-456
Author(s):  
Bashar F. Midhat
Keyword(s):  
Stability Analysis ◽  
Lyapunov Stability ◽  
Control Method ◽  
Power Electronic ◽  
Electronic Circuits ◽  
Dc Voltage ◽  
Power Electronic Circuits ◽  
Lyapunov Stability Criterion ◽  
Control Step ◽  
Step Down

Step down DC-DC converters are power electronic circuits, which mainly used to convert voltage from a level to a lower level. In this paper, a discontinuous controller is proposed as a control method in order to control Step-Down DC-DC converters. A Lyapunov stability criterion is used to mathematically prove the ability of the proposed controller to give the desired voltage. Simulationsl1 are performedl1 in MATLABl1 software. The simulationl1 resultsl1 are presentedl1 for changesl1 in referencel1 voltagel1 and inputl1 voltagel1 as well as stepl1 loadl1 variations. The resultsl1 showl1 the goodl1 performancel1 of the proposedl1 discontinuousl1 controller.

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