InAs: extinction coefficient, refractive index

2010 ◽  
pp. 218-218
Author(s):  
E. C. Fernandes da Silva
Keyword(s):  
Refractive Index ◽  
Extinction Coefficient

scholarly journals Optical Characterization of AsxTe100−x Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method

Materials ◽  
2020 ◽  
Vol 13 (13) ◽  
pp. 2981 ◽  
Author(s):  
Dorian Minkov ◽  
George Angelov ◽  
Radi Nestorov ◽  
Aleksey Nezhdanov ◽  
Dmitry Usanov ◽  
...  
Keyword(s):  
Refractive Index ◽  
Extinction Coefficient ◽  
Glass Substrate ◽  
Plasma Deposition ◽  
Optical Characterization ◽  
The Other ◽  
Semiconductor Film ◽  
Average Thickness ◽  
Envelope Method

Three AsxTe100−x films with different x and dissimilar average thickness d ¯ are characterized mainly from one interference transmittance spectrum T(λ = 300 to 3000 nm) of such film on a substrate based on the advanced optimizing envelope method (AOEM). A simple dual transformation of T(λ) is proposed and used for increasing the accuracy of computation of its envelopes T+(λ) and T−(λ) accounting for the significant glass substrate absorption especially for λ > 2500 nm. The refractive index n(λ) of As40Te60 and As98Te2 films is determined with a relative error <0.30%. As far as we know, the As80Te20 film is the only one with anomalous dispersion and the thickest, with estimated d ¯ = 1.1446 nm, ever characterized by an envelope method. It is also shown and explained why the extinction coefficient k(λ) of any of the three AsxTe100−x films is computed more accurately from the quantity Ti(λ) = [T+(λ)T−(λ)]0.5 compared to its commonly employed computation from T+(λ). The obtained results strengthen our conviction that the AOEM has a capacity for providing most accurate optical characterization of almost every dielectric or semiconductor film with d ¯ > 300 nm on a substrate, compared to all the other methods for characterization of such films only from T(λ).

Composition Effect of Poly(3,4-Ethylenedioxythiophene):Poly(Styrene Sulphonic Acid) and Polyaniline to Dispersion and Optical Properties of Polymer Blends

2016 ◽  
Vol 846 ◽  
pp. 225-229 ◽  
Author(s):  
N.F.M. Sahapini ◽  
Ahmad Nazib Alias ◽  
Z.M. Zabidi ◽  
Mohd Ashmir Yahya
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Polymer Blends ◽  
Photon Energy ◽  
Extinction Coefficient ◽  
Sulphonic Acid ◽  
Optical Parameters ◽  
Normal Dispersion ◽  
Casting Technique ◽  
Optical Dielectric

A Polymer blends compose of Poly (3,4-ethylenedioxythiophene):Poly (styrene sulphonic acid)(PEDOT:PSS) and Polyaniline (PANi) have been prepared using drop casting technique. Optical parameters such as refractive index (n), extinction coefficient (k), reflectance, and optical dielectric were determined in this study. It is found that reflectance spectra increase as the PANi concentration decreases in the sample of small photon energy. The refractive index of the sample shows significant effect with the PEDOT:PSS concentration. As the concentration of PEDOT:PSS increases, the refractive index shows a normal dispersion behavior. Extinction coefficient decrease as the wavelength increase within the range of 300 nm to 350 nm that may contribute to the loss fraction of light due to scattering and the decreasing of absorbance at this range. However, the extinction coefficient increases from 350 nm to the maximum wavelength of 800 nm since the absorbance is also increasing. Both the real and imaginary part of the dielectric constant decreases when the photon energy increases. This revealed that the compositions of PEDOT:PSS influence the optical properties of hybrid PEDOT-PSS:PANi thin film.

The Influence of Bi Content on the Properties of Bismuth Ferrite Thin Films Fabricated by Magnetron Sputtering

2013 ◽  
Vol 745-746 ◽  
pp. 131-135
Author(s):  
Hu Rui Yan ◽  
Nuo Fan Ding ◽  
Gang Wu ◽  
Ping Xiong Yang ◽  
Jun Hao Chu ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Magnetron Sputtering ◽  
Extinction Coefficient ◽  
Energy Gap ◽  
Lattice Mismatch ◽  
Bismuth Ferrite ◽  
Film Surface ◽  
Si Substrate ◽  
Impurity Phases

In the process of BiFeO3 film preparation by magnetron sputtering, Bi element is volatile, leading to the films which often appear impurity phases. Therefore, Both Bi excessive 5% (B1.05FO) and 8% (B1.08FO) BFO film in Si substrate were prepared by magnetron sputtering. X-Ray Diffraction (XRD) results showed that the BFO thin films fabricated in the Si substrate are perovskite structure, that the B1.08FO film appeared less impurity phases than B1.05FO film, and that stress due to substrate lattice mismatch caused the shift of XRD patterns. In Raman study, it was concluded that both B1.08FO film and B1.05FO film appeared ten Raman peaks in the range from 50cm-1 to 800cm-1, and that B1.08FO Raman peaks intensity was stronger in 137.1cm-1.168.5cm-1 and 215.3cm-1. Spectroscopic ellipsometry test showed that the refractive index and the extinction coefficient of B1.05FO film were 2.25 and 0.07 respectively in 600 nm with 2.67eV of energy gap; the refractive index and the extinction coefficient of B1.08FO film were 2.14 and 0.05 in 600 nm respectively with 2.71eV of energy gap. Atomic Force Microscope (AFM) was used to characterize the film surface morphology, finding that the B1.08FO film prepared in Si substrate was denser while grain size and surface roughness were smaller.

Estimating refractive index structure constant and extinction coefficient under misalignment

Optik ◽  
2020 ◽  
Vol 206 ◽  
pp. 164182
Author(s):  
Dagang Jiang ◽  
Ting Lyu ◽  
Xin Liu ◽  
Yishuai Yuan ◽  
Bin Zhu
Keyword(s):  
Refractive Index ◽  
Extinction Coefficient ◽  
Structure Constant ◽  
Index Structure

Refractive Index and Extinction Coefficient of Hg 1- x Cd x Te at 77 and 300 K

1994 ◽  
Vol 11 (5) ◽  
pp. 314-316 ◽  
Author(s):  
Runqing Jiang ◽  
Shuzhi Zhang ◽  
Feifei Wu ◽  
Xierong Hu ◽  
Jiaxiong Fang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Extinction Coefficient

Modeling of the refractive index and extinction coefficient of binary composite films

2001 ◽  
Vol 40 (34) ◽  
pp. 6301 ◽  
Author(s):  
Meenakshi Kar ◽  
Bhullan S. Verma ◽  
Amitabha Basu ◽  
Raghunath Bhattacharyya
Keyword(s):  
Refractive Index ◽  
Extinction Coefficient ◽  
Composite Films ◽  
Binary Composite

Optical Nonlinearity of Sputtered Co3O4-SiO2-TiO2 Thin Films

2001 ◽  
Vol 703 ◽  
Author(s):  
Hiroki Yamamoto ◽  
Takashi Naito ◽  
Kazuyuki Hirao
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Excited State ◽  
Absorption Coefficient ◽  
Extinction Coefficient ◽  
Ground State ◽  
Optical Nonlinearity ◽  
Tio2 Thin Films ◽  
Change Mechanism ◽  
Band Filling

ABSTRACTOptical non-linearity of cobalt oxide with SiO2-TiO2 additives was investigated, and the change mechanism of the refractive index (n) and extinction coefficient (k), based on the relation between band structure and optical non-linearity of the thin films, was discussed. Refractive index and extinction coefficient of Co3O4 thin films in the ground state were 3.17 and 0.42, respectively. Both n and k decreased by irradiation from a pulse laser with 650 nm of wavelength (1.91eV). These values in the excited state were 2.91 and 0.41, respectively. n2 estimated from the change of n and k was −2.8 ×10−11 m2/W. The film had a band gap corresponding to 2.06eV, indicating that it was widened by the band filling effect during the laser irradiation at 1.91eV, and this led to the decrease in absorption coefficient and refractive index.

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