High Energy and Angular Resolution Dynamic Secondary Ion Mass Spectrometry

High Energy ◽

Ion Mass Spectrometry ◽

The mechanism of simultaneous implantation and sputtering by high energy oxygen ions during secondary ion mass spectrometry (SIMS) analysis

Surface Science ◽

10.1016/0039-6028(74)90105-8 ◽

1974 ◽

Vol 44 (1) ◽

pp. 247-252 ◽

Cited By ~ 58

Author(s):

J.C.C. Tsai ◽

J.M. Morabito

Keyword(s):

Mass Spectrometry ◽

High Energy ◽

Oxygen Ions ◽

Ion Mass Spectrometry ◽

Sims Analysis ◽

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS

10.1016/j.nimb.2010.02.045 ◽

2010 ◽

Vol 268 (11-12) ◽

pp. 1714-1717 ◽

Cited By ~ 18

Author(s):

Brian N. Jones ◽

Vladimir Palitsin ◽

Roger Webb

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Time Of Flight ◽

High Energy ◽

Ion Mass Spectrometry ◽

Pixe And Rbs ◽

Detection of lithium in scalp hair by time-of-flight secondary ion mass spectrometry with high energy (MeV) primary ions

Analytical Methods ◽

10.1039/c7ay01616f ◽

2017 ◽

Vol 9 (36) ◽

pp. 5249-5253 ◽

Cited By ~ 5

Author(s):

Karen J. Cloete ◽

Boštjan Jenčič ◽

Žiga Šmit ◽

Mitja Kelemen ◽

Kwezikazi Mkentane ◽

...

Keyword(s):

Mass Spectrometry ◽

Scalp Hair ◽

Time Of Flight ◽

High Energy ◽

Ion Mass Spectrometry ◽

Primary Ions ◽

The application of MeV-SIMS is presented for the detection and mapping of lithium in chemically unprocessed, longitudinally sectioned scalp hair.

Focused, rasterable, high-energy neutral molecular beam probe for secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00140a022 ◽

1987 ◽

Vol 59 (13) ◽

pp. 1685-1691 ◽

Cited By ~ 53

Author(s):

Anthony D. Appelhans ◽

James E. Delmore ◽

David A. Dahl

Keyword(s):

Mass Spectrometry ◽

Molecular Beam ◽

High Energy ◽

Ion Mass Spectrometry ◽

Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging

Analytical Chemistry ◽

10.1021/acs.analchem.9b01390 ◽

2019 ◽

Vol 91 (14) ◽

pp. 9058-9068 ◽

Cited By ~ 1

Author(s):

Sadia Sheraz ◽

Hua Tian ◽

John C. Vickerman ◽

Paul Blenkinsopp ◽

Nicholas Winograd ◽

...

Keyword(s):

Mass Spectrometry ◽

Water Cluster ◽

High Energy ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

Ion Yields ◽

Cluster Beams ◽

Quantification Method Using the Inverse Velocity Dependence of Ion Intensities in Secondary Ion Mass Spectrometry: the High-Energy Method.

Analytical Sciences ◽

10.2116/analsci.14.281 ◽

1998 ◽

Vol 14 (2) ◽

pp. 281-286 ◽

Cited By ~ 3

Author(s):

Yasuhiro HIGASHI ◽

Yoshikazu HOMMA

Keyword(s):

Mass Spectrometry ◽

Energy Method ◽

High Energy ◽

Velocity Dependence ◽

Quantification Method ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Inverse Velocity

High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry

International Journal of Mass Spectrometry ◽

10.1016/j.ijms.2014.05.015 ◽

2015 ◽

Vol 377 ◽

pp. 591-598 ◽

Cited By ~ 58

Author(s):

Tina B. Angerer ◽

Paul Blenkinsopp ◽

John S. Fletcher

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

High Energy ◽

Cluster Ions ◽

Biological Analysis ◽

Ion Mass Spectrometry ◽

Secondary ion mass spectrometry and its relation to high-energy ion beam analysis techniques

Nuclear Instruments and Methods in Physics Research ◽

10.1016/0029-554x(81)91019-3 ◽

1981 ◽

Vol 191 (1-3) ◽

pp. 297-307 ◽

Cited By ~ 27

Author(s):

Charles W. Magee

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

High Energy ◽

Ion Beam Analysis ◽

Analysis Techniques ◽

Beam Analysis ◽

Ion Mass Spectrometry ◽

Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.

Microscopy and Microanalysis ◽

10.1017/s1431927617011102 ◽

2017 ◽

Vol 23 (S1) ◽

pp. 2088-2089

Author(s):

S. Bessette ◽

P. Hovington ◽

C. Kim ◽

R. Gauvin ◽

H. Demers ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

High Energy ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Multiomics Imaging Using High-Energy Water Gas Cluster Ion Beam Secondary Ion Mass Spectrometry [(H2O)n-GCIB-SIMS] of Frozen-Hydrated Cells and Tissue

Analytical Chemistry ◽

10.1021/acs.analchem.0c05210 ◽

2021 ◽

Author(s):

Hua Tian ◽

Sadia Sheraz née Rabbani ◽

John C. Vickerman ◽

Nicholas Winograd

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

High Energy ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Water Gas ◽