Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS

2010 ◽  
Vol 268 (11-12) ◽  
pp. 1714-1717 ◽  
Author(s):  
Brian N. Jones ◽  
Vladimir Palitsin ◽  
Roger Webb
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
High Energy ◽  
Ion Mass Spectrometry ◽  
Pixe And Rbs ◽  
Secondary Ion

Detection of lithium in scalp hair by time-of-flight secondary ion mass spectrometry with high energy (MeV) primary ions

2017 ◽  
Vol 9 (36) ◽  
pp. 5249-5253 ◽  
Author(s):  
Karen J. Cloete ◽  
Boštjan Jenčič ◽  
Žiga Šmit ◽  
Mitja Kelemen ◽  
Kwezikazi Mkentane ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Scalp Hair ◽  
Time Of Flight ◽  
High Energy ◽  
Ion Mass Spectrometry ◽  
Primary Ions ◽  
Secondary Ion

The application of MeV-SIMS is presented for the detection and mapping of lithium in chemically unprocessed, longitudinally sectioned scalp hair.

scholarly journals Surface Analysis of Copper Patinas Formed Outdoors by using Time-of-flight Secondary Ion Mass Spectrometry

2006 ◽  
Vol 55 (4) ◽  
pp. 146-151
Author(s):  
Masamitsu Watanabe ◽  
Takao Handa ◽  
Toshihiro Ichino ◽  
Nobuo Kuwaki
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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