Dynamic Friction Measurement with the Scanning Force Microscope

Fundamentals of Tribology and Bridging the Gap Between the Macro- and Micro/Nanoscales ◽

10.1007/978-94-010-0736-8_8 ◽

2001 ◽

pp. 121-135 ◽

Author(s):

Othmar Marti ◽

Hans-Ulrich Krotil

Keyword(s):

Dynamic Friction ◽

Friction Measurement ◽

Scanning Force Microscope ◽

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Combined dynamic adhesion and friction measurement with the scanning force microscope

Applied Physics Letters ◽

10.1063/1.1329630 ◽

2000 ◽

Vol 77 (23) ◽

pp. 3857-3859 ◽

Author(s):

H.-U. Krotil ◽

Th. Stifter ◽

O. Marti

Keyword(s):

Friction Measurement ◽

Scanning Force Microscope ◽

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Dynamic friction force measurement with the scanning force microscope

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199905/06)27:5/6<341::aid-sia513>3.0.co;2-b ◽

1999 ◽

Vol 27 (5-6) ◽

pp. 341-347 ◽

Author(s):

H.-U. Krotil ◽

E. Weilandt ◽

Th. Stifter ◽

O. Marti ◽

S. Hild

Keyword(s):

Friction Force ◽

Force Measurement ◽

Dynamic Friction ◽

Scanning Force Microscope ◽

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Measurement of nanohardness and nanoelasticity of thin gold films with scanning force microscope

Applied Physics Letters ◽

10.1063/1.126976 ◽

2000 ◽

Vol 77 (3) ◽

pp. 361-363 ◽

Author(s):

B. Kracke ◽

B. Damaschke

Keyword(s):

Scanning Force Microscope ◽

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Towards quantitative determination of the spring constant of a scanning force microscope cantilever with a microelectromechanical nano-force actuator

Measurement Science and Technology ◽

10.1088/0957-0233/21/1/015103 ◽

2009 ◽

Vol 21 (1) ◽

pp. 015103 ◽

Author(s):

Sai Gao ◽

Zhikai Zhang ◽

Yong Wu ◽

Konrad Herrmann

Keyword(s):

Quantitative Determination ◽

Spring Constant ◽

Scanning Force Microscope ◽

Scanning Force ◽

Force Microscope Cantilever

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Compact scanning-force microscope using a laser diode

Optics Letters ◽

10.1364/ol.13.001057 ◽

1988 ◽

Vol 13 (12) ◽

pp. 1057 ◽

Author(s):

Dror Sarid ◽

L. Stephen Bell ◽

Doug Iams ◽

Volker Weissenberger

Keyword(s):

Laser Diode ◽

Scanning Force Microscope ◽

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Nanoindentation combined with scanning force microscope for characterization of mechanical properties of carbon nitride thin films

Surface and Coatings Technology ◽

10.1016/s0257-8972(03)00924-1 ◽

2004 ◽

Vol 177-178 ◽

pp. 537-544 ◽

Author(s):

S. Chowdhury ◽

M.T. Laugier ◽

I.Z. Rahman ◽

M. Serantoni

Keyword(s):

Mechanical Properties ◽

Carbon Nitride ◽

Scanning Force Microscope ◽

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Nanometer‐scale field‐induced oxidation of Si(111):H by a conducting‐probe scanning force microscope: Doping dependence and kinetics

Applied Physics Letters ◽

10.1063/1.114861 ◽

1995 ◽

Vol 67 (21) ◽

pp. 3144-3146 ◽

Author(s):

T. Teuschler ◽

K. Mahr ◽

S. Miyazaki ◽

M. Hundhausen ◽

L. Ley

Keyword(s):

Nanometer Scale ◽

Scanning Force Microscope ◽

Doping Dependence ◽

Scale Field ◽

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Validating a Device for Measuring the Coefficient of Dynamic Friction of the Fingertip Pad Coefficient of Dynamic Friction Measurement

2021 3rd International Conference on Management Science and Industrial Engineering ◽

10.1145/3460824.3460856 ◽

2021 ◽

Author(s):

Peng-Cheng Sung ◽

Yung-Ping Liu ◽

I-Lung Chen ◽

Chia-Yung Chou

Keyword(s):

Dynamic Friction ◽

Friction Measurement

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Sample Holders for Imaging Intact Particles with the Scanning Force Microscope

Atomic Force Microscopy/Scanning Tunneling Microscopy ◽

10.1007/978-1-4757-9322-2_33 ◽

1994 ◽

pp. 327-338 ◽

Author(s):

A. A. Garcia ◽

M. Edwards

Keyword(s):

Scanning Force Microscope ◽

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Surface structures and energy gap of YBa2Cu3Oy/PrBa2Cu3Oy superlattices and YBa2Cu3Oy thin films probed with a scanning tunneling microscope and a scanning force microscope

Physica C Superconductivity ◽

10.1016/0921-4534(95)00590-0 ◽

1995 ◽

Vol 255 (1-2) ◽

pp. 30-36 ◽

Author(s):

Y. Chen ◽

L.M. Wang ◽

H.C. Yang ◽

H.E. Horng ◽

H.H. Sung

Keyword(s):

Scanning Tunneling Microscope ◽

Surface Structures ◽

Scanning Tunneling ◽

Scanning Force Microscope ◽

Tunneling Microscope ◽

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