Evaluation of Creep Damage Development of Quasi-Plastic GPS Silicon Nitride by X-Ray CT

Author(s):  
H. Usami ◽  
F. Lofaj ◽  
A. Okada ◽  
Y. Ikeda ◽  
Y. Mizuta ◽  
...  
1990 ◽  
Vol 5 (3) ◽  
pp. 121-124 ◽  
Author(s):  
David J. Devlin ◽  
Kamal E. Amin

AbstractThe relative intensities ratios for the determination of the relative amounts of alpha and beta phases in silicon nitride and the relative amounts of delta yttrium disilicate (Y2Si2O7) and nitrogen apatite [Y5(SiO4)3N] are reported. These constants were determined using an iterative method applicable when the pure phases are not easily prepared. In addition, a calibration curve was obtained for the quantitative measurement of free silicon in silicon nitride over the range 0 to 0.3% by weight of Si.


2014 ◽  
Vol 940 ◽  
pp. 46-51 ◽  
Author(s):  
Xin Yang ◽  
Qiang Xu ◽  
Zhong Yu Lu ◽  
Simon Barrans

This review paper mainly consists of from two aspects: (a) the evolution of the cavitation damage equation from Dyson to current application in high Cr steels by traditional techniques; (b) quantitation analyses of cavitation behavior in brass, copper, dual phase steel from X-ray microtomtograph. Though there is a lack of experimental data for high Cr steels by X-ray microtomography currently, but (b) has provided reference value for studying creep cavitation behavior in high Cr steels. This paper will be the fundamental of development new creep damage constitutive equation through quantitation analyses of X-ray tomography.


1990 ◽  
pp. 319-326 ◽  
Author(s):  
Zenjiro Yajima ◽  
Yukio Hirose ◽  
Keisuke Tanaka

2020 ◽  
Vol 27 (6) ◽  
pp. 1703-1706
Author(s):  
D. P. Siddons ◽  
A. J. Kuczewski ◽  
A. K. Rumaiz ◽  
R. Tappero ◽  
M. Idir ◽  
...  

The design and construction of an instrument for full-field imaging of the X-ray fluorescence emitted by a fully illuminated sample are presented. The aim is to produce an X-ray microscope with a few micrometers spatial resolution, which does not need to scan the sample. Since the fluorescence from a spatially inhomogeneous sample may contain many fluorescence lines, the optic which will provide the magnification of the emissions must be achromatic, i.e. its optical properties must be energy-independent. The only optics which fulfill this requirement in the X-ray regime are mirrors and pinholes. The throughput of a simple pinhole is very low, so the concept of coded apertures is an attractive extension which improves the throughput by having many pinholes, and retains the achromatic property. Modified uniformly redundant arrays (MURAs) with 10 µm openings and 50% open area have been fabricated using gold in a lithographic technique, fabricated on a 1 µm-thick silicon nitride membrane. The gold is 25 µm thick, offering good contrast up to 20 keV. The silicon nitride is transparent down into the soft X-ray region. MURAs with various orders, from 19 up to 73, as well as their respective negative (a mask where open and closed positions are inversed compared with the original mask), have been made. Having both signs of mask will reduce near-field artifacts and make it possible to correct for any lack of contrast.


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