Digital-Controlled Dual-Mode Switching Mode Power Supply for Low-Power Applications

2019 ◽  
pp. 183-195
Author(s):  
K. Shubha Rao ◽  
Veena S. Chakravarthi
Keyword(s):  
Low Power ◽  
Power Supply ◽  
Mode Switching ◽  
Dual Mode ◽  
Switching Mode Power Supply ◽  
Switching Mode

scholarly journals Analysis of the Degradation of MOSFETs in Switching Mode Power Supply by Characterizing Source Oscillator Signals

2013 ◽  
Vol 2013 ◽  
pp. 1-7 ◽  
Author(s):  
Xueyan Zheng ◽  
Lifeng Wu ◽  
Yong Guan ◽  
Xiaojuan Li
Keyword(s):  
Power Supply ◽  
High Speed ◽  
Nuclear Power ◽  
Low Voltage ◽  
Junction Temperature ◽  
Factors Affecting ◽  
Die Attach ◽  
Switching Mode Power Supply ◽  
Switching Mode ◽  
State Resistance

Switching Mode Power Supply (SMPS) has been widely applied in aeronautics, nuclear power, high-speed railways, and other areas related to national strategy and security. The degradation of MOSFET occupies a dominant position in the key factors affecting the reliability of SMPS. MOSFETs are used as low-voltage switches to regulate the DC voltage in SMPS. The studies have shown that die-attach degradation leads to an increase in on-state resistance due to its dependence on junction temperature. On-state resistance is the key indicator of the health of MOSFETs. In this paper, an online real-time method is presented for predicting the degradation of MOSFETs. First, the relationship between an oscillator signal of source and on-state resistance is introduced. Because oscillator signals change when they age, a feature is proposed to capture these changes and use them as indicators of the state of health of MOSFETs. A platform for testing characterizations is then established to monitor oscillator signals of source. Changes in oscillator signal measurement were observed with aged on-state resistance as a result of die-attach degradation. The experimental results demonstrate that the method is efficient. This study will enable a method to predict the failure of MOSFETs to be developed.

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