Depth profiling by ARXPS in surface analysis

1995 ◽  
Vol 353 (3-4) ◽  
pp. 473-477 ◽  
Author(s):  
H. Fischer ◽  
R. Svagera ◽  
H. Ebel ◽  
M. F. Ebel ◽  
B. Scho�mann
Keyword(s):  
Surface Analysis ◽  
Depth Profiling

scholarly journals Surface analysis and depth profiling of corrosion products formed in lead pipes used to supply low alkalinity drinking water

2004 ◽  
Vol 49 (2) ◽  
pp. 49-54 ◽  
Author(s):  
C.M. Davidson ◽  
N.J. Peters ◽  
A. Britton ◽  
L. Brady ◽  
P.H.E. Gardiner ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Corrosion Product ◽  
Distribution System ◽  
Depth Profiling ◽  
Corrosion Products ◽  
Depth Range ◽  
Lead Carbonate ◽  
X Ray ◽  
Calcium Iron

Modern analytical techniques have been applied to investigate the nature of lead pipe corrosion products formed in pH adjusted, orthophosphate-treated, low alkalinity water, under supply conditions. Depth profiling and surface analysis have been carried out on pipe samples obtained from the water distribution system in Glasgow, Scotland, UK. X-ray diffraction spectrometry identified basic lead carbonate, lead oxide and lead phosphate as the principal components. Scanning electron microscopy/energy-dispersive x-ray spectrometry revealed the crystalline structure within the corrosion product and also showed spatial correlations existed between calcium, iron, lead, oxygen and phosphorus. Elemental profiling, conducted by means of secondary ion mass spectrometry (SIMS) and secondary neutrals mass spectrometry (SNMS) indicated that the corrosion product was not uniform with depth. However, no clear stratification was apparent. Indeed, counts obtained for carbonate, phosphate and oxide were well correlated within the depth range probed by SIMS. SNMS showed relationships existed between carbon, calcium, iron, and phosphorus within the bulk of the scale, as well as at the surface. SIMS imaging confirmed the relationship between calcium and lead and suggested there might also be an association between chloride and phosphorus.

scholarly journals Results of Questionnaire Survey on Depth Profiling Performed in Surface Analysis Society of Japan

2016 ◽  
Vol 23 (2) ◽  
pp. 98-110
Author(s):  
T. Nagatomi ◽  
K. Takahashi ◽  
H. Yoshikawa
Keyword(s):  
Surface Analysis ◽  
Questionnaire Survey ◽  
Depth Profiling ◽  
Analysis Society

Depth profiling by ARXPS in surface analysis

1995 ◽  
Vol 353 (3-4) ◽  
pp. 473-477
Author(s):  
H. Fischer ◽  
R. Svagera ◽  
H. Ebel ◽  
M. F. Ebel ◽  
B. Scho�mann
Keyword(s):  
Surface Analysis ◽  
Depth Profiling

Surface Analysis and Ultra-Shallow Molecular Depth-Profiling of Polyethylene Treated by an Atmospheric Ar-D2O Post-Discharge

2015 ◽  
Vol 12 (9) ◽  
pp. 919-925 ◽  
Author(s):  
Vanina Cristaudo ◽  
Stéphanie Collette ◽  
Claude Poleunis ◽  
François Reniers ◽  
Arnaud Delcorte
Keyword(s):  
Surface Analysis ◽  
Depth Profiling ◽  
Post Discharge ◽  
Molecular Depth Profiling
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