Characterization of surface oxides on water-atomized steel powder by XPS/AES depth profiling and nano-scale lateral surface analysis

2013 ◽  
Vol 268 ◽  
pp. 496-506 ◽  
Author(s):  
D. Chasoglou ◽  
E. Hryha ◽  
M. Norell ◽  
L. Nyborg
Keyword(s):  
Surface Analysis ◽  
Lateral Surface ◽  
Depth Profiling ◽  
Steel Powder ◽  
Nano Scale ◽  
Surface Oxides

Recent Characterization of Steel by Surface Analysis Methods

1996 ◽  
Vol 82 (7) ◽  
pp. 551-557
Author(s):  
Shigeru SUZUKI
Keyword(s):  
Surface Analysis ◽  
Analysis Methods

Cryogenic Characterization of Nano-scale Bulk FinFETs

2020 ◽  
Author(s):  
Lin-Jie Fan ◽  
Jin-Shun Bi ◽  
Xue Fan ◽  
Gao-Bo Xu ◽  
Yan-Nan Xu ◽  
...  
Keyword(s):  
Nano Scale

scholarly journals Nano-scale actin-network characterization of fibroblast cells lacking functional Arp2/3 complex

2017 ◽  
Vol 197 (3) ◽  
pp. 312-321 ◽  
Author(s):  
Karen L. Anderson ◽  
Christopher Page ◽  
Mark F. Swift ◽  
Praveen Suraneni ◽  
Mandy E.W. Janssen ◽  
...  
Keyword(s):  
Fibroblast Cells ◽  
Actin Network ◽  
Nano Scale ◽  
Network Characterization

Structural and Electrical Characterization of Si-Implanted TiN as a Diffusion Barrier for Cu Metallization

1995 ◽  
Vol 391 ◽  
Author(s):  
W.F. Mcarthur ◽  
K.M. Ring ◽  
K.L. Kavanagh
Keyword(s):  
Leakage Current ◽  
Diffusion Barrier ◽  
Depth Profiling ◽  
Electrical Characterization ◽  
Implantation Dose ◽  
Cu Metallization ◽  
Reverse Leakage Current ◽  
Transmission Electron ◽  
Current Voltage

AbstractThe feasibility of Si-implanted TiN as a diffusion barrier between Cu and Si was investigated. Barrier effectiveness was evaluated via reverse leakage current of Cu/TixSiyNz/Si diodes as a function of post-deposition annealing temperature and time, and was found to depend heavily on the film composition and microstructure. TiN implanted with Si28, l0keV, 5xl016ions/cm2 formed an amorphous ternary TixSiyNz layer whose performance as a barrier to Cu diffusion exceeded that of unimplanted, polycrystalline TiN. Results from current-voltage, transmission electron microscopy (TEM), and Auger depth profiling measurements will be presented. The relationship between Si-implantation dose, TixSiyNz structure and reverse leakage current of Cu/TixSiyNz/Si diodes will be discussed, along with implications as to the suitability of these structures in Cu metallization.

scholarly journals A comprehensive influenza reporter virus panel for high-throughput deep profiling of neutralizing antibodies

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Adrian Creanga ◽  
Rebecca A. Gillespie ◽  
Brian E. Fisher ◽  
Sarah F. Andrews ◽  
Julia Lederhofer ◽  
...  
Keyword(s):  
Neutralizing Antibodies ◽  
Depth Profiling ◽  
Influenza Viruses ◽  
Effective Vaccine ◽  
Viral Gene ◽  
Broadly Neutralizing Antibodies ◽  
Level 2 ◽  
Biosafety Level ◽  
Major Target

AbstractBroadly neutralizing antibodies (bnAbs) have been developed as potential countermeasures for seasonal and pandemic influenza. Deep characterization of these bnAbs and polyclonal sera provides pivotal understanding for influenza immunity and informs effective vaccine design. However, conventional virus neutralization assays require high-containment laboratories and are difficult to standardize and roboticize. Here, we build a panel of engineered influenza viruses carrying a reporter gene to replace an essential viral gene, and develop an assay using the panel for in-depth profiling of neutralizing antibodies. Replication of these viruses is restricted to cells expressing the missing viral gene, allowing it to be manipulated in a biosafety level 2 environment. We generate the neutralization profile of 24 bnAbs using a 55-virus panel encompassing the near-complete diversity of human H1N1 and H3N2, as well as pandemic subtype viruses. Our system offers in-depth profiling of influenza immunity, including the antibodies against the hemagglutinin stem, a major target of universal influenza vaccines.

Characterization of multi-scale porous structure of fly ash/phosphate geopolymer hollow sphere structures: From submillimeter to nano-scale

Micron ◽  
2015 ◽  
Vol 68 ◽  
pp. 54-58 ◽  
Author(s):  
Ruifeng Li ◽  
Gaohui Wu ◽  
Longtao Jiang ◽  
Dongli Sun
Keyword(s):  
Fly Ash ◽  
Porous Structure ◽  
Hollow Sphere ◽  
Multi Scale ◽  
Nano Scale

Photoacoustic FT-IR Spectroscopy of Natural Copper Patina

1995 ◽  
Vol 49 (10) ◽  
pp. 1516-1524 ◽  
Author(s):  
Alex O. Salnick ◽  
Werner Faubel
Keyword(s):  
Depth Distribution ◽  
Depth Profiling ◽  
Beam Deflection ◽  
City Hall ◽  
Spectral Bands ◽  
Special Sample Preparation ◽  
Ft Ir ◽  
Infrared Photoacoustic Spectroscopy ◽  
Ft Ir Spectroscopy

Fourier transform infrared photoacoustic spectroscopy (FT-IR/PAS) has proved to be a useful tool for nondestructive testing of copper corrosion layer (patina) formed in the atmosphere. The samples cut from a piece of the roof of the Stockholm City Hall were examined without any additional pretreatment. The components of the patina—brochantite Cu4(OH)6SO4, antlerite Cu3(OH)4SO4, and basic cupric carbonate Cu2CO3(OH)6 · H2O—as well as some other minerals were identified. The photothermal beam deflection (PBD) method was used for independent photoacoustic characterization of the samples. The depth profiling capability of FT-IR/PAS was used to determine the degree of photoacoustic saturation of the spectral bands and to evaluate the depth distribution of the main patina components. The technique thus compares favorably with more common approaches of patina examination which are more expensive and require special sample preparation.

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