Ultrasound-assisted impregnation of barium titanate into microporous polyethylene membranes for the production of highly dielectric films

1993 ◽  
Vol 12 (23) ◽  
pp. 1810-1811
Author(s):  
Poopathy Kathirgamanathan
Polymers ◽  
2019 ◽  
Vol 11 (12) ◽  
pp. 2123 ◽  
Author(s):  
Udhay Sundar ◽  
Zichen Lao ◽  
Kimberly Cook-Chennault

Polymer-ceramic nanocomposite piezoelectric and dielectric films are of interest because of their possible application to advanced embedded energy storage devices for printed wired electrical boards. The incompatibility of the two constituent materials; hydrophilic ceramic filler, and hydrophobic epoxy limit the filler concentration, and thus, their piezoelectric properties. This work aims to understand the role of surfactant concentration in establishing meaningful interfacial layers between the epoxy and ceramic filler particles by observing particle surface morphology, piezoelectric strain coefficients, and resistivity spectra. A comprehensive study of nanocomposites, comprising non-treated and surface treated barium titanate (BTO), embedded within an epoxy matrix, was performed. The surface treatments were performed with two types of coupling agents: Ethanol and 3-glycidyloxypropyltrimethoxysilan. The observations of particle agglomeration, piezoelectric strain coefficients, and resistivity were compared, where the most ideal properties were found for concentrations of 0.02 and 0.025. This work demonstrates that the interfacial core-shell processing layer concentration influences the macroscopic properties of nanocomposites, and the opportunities for tuning interfacial layers for desirable characteristics of specific applications.


2017 ◽  
Vol 100 (10) ◽  
pp. 4511-4518 ◽  
Author(s):  
Razvan Rotaru ◽  
Cristian Peptu ◽  
Petrisor Samoila ◽  
Valeria Harabagiu

Polymers ◽  
2020 ◽  
Vol 12 (4) ◽  
pp. 827 ◽  
Author(s):  
Udhay Sundar ◽  
Zichen Lao ◽  
Kimberly Cook-Chennault

High permittivity polymer-ceramic nanocomposite dielectric films take advantage of the ease of flexibility in processing of polymers and the functionality of electroactive ceramic fillers. Hence, films like these may be applied to embedded energy storage devices for printed circuit electrical boards. However, the incompatibility of the hydrophilic ceramic filler and hydrophobic epoxy limit the filler concentration and therefore, dielectric permittivity of these materials. Traditionally, surfactants and core-shell processing of ceramic fillers are used to achieve electrostatic and steric stabilization for adequate ceramic particle distribution but, questions regarding these processes still remain. The purpose of this work is to understand the role of surfactant concentration ceramic particle surface morphology, and composite dielectric permittivity and conductivity. A comprehensive study of barium titanate-based epoxy nanocomposites was performed. Ethanol and 3-glycidyloxypropyltrimethoxysilan surface treatments were performed, where the best reduction in particle agglomeration, highest value of permittivity and the lowest value of loss were observed. The results demonstrate that optimization of coupling agent may lead to superior permittivity values and diminished losses that are ~2–3 times that of composites with non-optimized and traditional surfactant treatments.


1986 ◽  
Author(s):  
C K. Hwangbo ◽  
M R. Jacobson ◽  
H A. Macleod ◽  
R H. Potoff

Author(s):  
V. Kaushik ◽  
P. Maniar ◽  
J. Olowolafe ◽  
R. Jones ◽  
A. Campbell ◽  
...  

Lead zirconium titanate films (Pb (Zr,Ti) O3 or PZT) are being considered for potential application as dielectric films in memory technology due to their high dielectric constants. PZT is a ferroelectric material which shows spontaneous polarizability, reversible under applied electric fields. We report herein some results of TEM studies on thin film capacitor structures containing PZT films with platinum-titanium electrodes.The wafers had a stacked structure consisting of PZT/Pt/Ti/SiO2/Si substrate as shown in Figure 1. Platinum acts as electrode material and titanium is used to overcome the problem of platinum adhesion to the oxide layer. The PZT (0/20/80) films were deposited using a sol-gel method and the structure was annealed at 650°C and 800°C for 30 min in an oxygen ambient. XTEM imaging was done at 200KV with the electron beam parallel to <110> zone axis of silicon.Figure 2 shows the PZT and Pt layers only, since the structure had a tendency to peel off at the Ti-Pt interface during TEM sample preparation.


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