Measuring method for the refractive index profile of optical glass fibres

1975 ◽  
Vol 7 (2) ◽  
pp. 109-113 ◽  
Author(s):  
W. Eickhoff ◽  
E. Weidel
Keyword(s):  
Refractive Index ◽  
Optical Glass ◽  
Measuring Method ◽  
Refractive Index Profile ◽  
Index Profile ◽  
Glass Fibres

Fabrication Applications of GRIN Materials

2012 ◽  
Vol 586 ◽  
pp. 215-220 ◽  
Author(s):  
Yu Lin Li ◽  
Bao Wen Hu ◽  
Zheng Quan He ◽  
Min Rui Zhang ◽  
Jun Min Huo ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Materials ◽  
Optical Glass ◽  
Refractive Index Profile ◽  
Gradient Index ◽  
Index Profile ◽  
Medical Endoscope ◽  
Exchange Method ◽  
Fiber Communications ◽  
Ion Exchange Method

In recent years, a series of gradient index (GRIN) materials including Optical glass and polymer have been Research and developed in our laboratory. The Micro-lenses and arrays with the special optical materials also have been fabricated mainly by using Ion-exchange method through refractive index profile, which are applied to micro-optic devices and other applications—— especially in the coupled and connected devices for fiber communications and medical endoscope or they are used primarily for document scanning equipments.

scholarly journals Near-infrared optical image transport through an all-solid tellurite optical glass rod with transversely-disordered refractive index profile

2018 ◽  
Vol 26 (13) ◽  
pp. 16054 ◽  
Author(s):  
Tong Hoang Tuan ◽  
Shunei Kuroyanagi ◽  
Kenshiro Nagasaka ◽  
Takenobu Suzuki ◽  
Yasutake Ohishi
Keyword(s):  
Refractive Index ◽  
Near Infrared ◽  
Optical Glass ◽  
Refractive Index Profile ◽  
Optical Image ◽  
Index Profile

scholarly journals Influence of Rugate Filters on the Spectral Manifestation of Tamm Plasmon Polaritons

Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1282
Author(s):  
Victor Reshetnyak ◽  
Igor Pinkevych ◽  
Timothy Bunning ◽  
Dean Evans
Keyword(s):  
Refractive Index ◽  
Band Gap ◽  
External Medium ◽  
Metal Layer ◽  
Refractive Index Profile ◽  
Spectral Position ◽  
Index Profile ◽  
Reflection And Transmission ◽  
Rugate Filter ◽  
Plasmon Polaritons

This study theoretically investigated light reflection and transmission in a system composed of a thin metal layer (Ag) adjacent to a rugate filter (RF) having a harmonic refractive index profile. Narrow dips in reflectance and peaks in transmittance in the RF band gap were obtained due to the excitation of a Tamm plasmon polariton (TPP) at the Ag–RF interface. It is shown that the spectral position and magnitude of the TPP dips/peaks in the RF band gap depend on the harmonic profile parameters of the RF refractive index, the metal layer thickness, and the external medium refractive index. The obtained dependences for reflectance and transmittance allow selecting parameters of the system which can be optimized for various applications.

Nondestructive refractive‐index profile measurements of clad optical fibers

1975 ◽  
Vol 26 (10) ◽  
pp. 574-575 ◽  
Author(s):  
M. E. Marhic ◽  
P. S. Ho ◽  
M. Epstein
Keyword(s):  
Refractive Index ◽  
Optical Fibers ◽  
Refractive Index Profile ◽  
Index Profile

REFRACTIVE INDEX PROFILE RECONSTRUCTION OF PLANAR WAVEGUIDE FROM ITS MODE INTENSITY USING CHARACTERISTIC MATRIX METHOD

2001 ◽  
Vol 10 (02) ◽  
pp. 169-179
Author(s):  
HENRI P. URANUS ◽  
M. O. TJIA
Keyword(s):  
Refractive Index ◽  
Intensity Distribution ◽  
Planar Waveguide ◽  
Nonlinear Least Squares ◽  
Refractive Index Profile ◽  
Characteristic Matrix ◽  
Least Squares Regression ◽  
Index Profile ◽  
Measured Intensity ◽  
Parameter Values

A method is proposed for the reconstruction of refractive index profile of planar waveguide from its fundamental mode intensity profile. The reconstruction is performed by fitting the calculated intensity distribution iteratively with the measured intensity distribution employing nonlinear least-squares regression technique. At each stage of iteration, new trial parameter values are generated and used to form a waveguide model approximated by a multilayer structure with stepwise index distribution, upon which the intensity distribution is then calculated by using the characteristic matrix technique. This method was numerically examined by using samples of either known or unknown analytic expression of the index profile.

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