Transient displacement fields in hexagonal crystals and transversally isotropic media

1977 ◽  
Vol 17 (2) ◽  
pp. 268-273
Author(s):  
V. S. Budaev
Keyword(s):  
Displacement Fields ◽  
Isotropic Media ◽  
Transversally Isotropic ◽  
Hexagonal Crystals

scholarly journals GENERAL SCALARIZATION METHOD OF DYNAMIC ELASTIC FIELDS IN TRANSVERSALLY ISOTROPIC MEDIA AND ITS NEW APPLICATIONS

2018 ◽  
Vol 18 (3) ◽  
pp. 258-264
Author(s):  
I. P. Miroshnichenko ◽  
V. P. Sizov
Keyword(s):  
Symmetry Axis ◽  
Layered Structures ◽  
Mutual Arrangement ◽  
Material Symmetry ◽  
Displacement Fields ◽  
General Technique ◽  
Elastic Fields ◽  
Scalarization Method ◽  
Isotropic Media ◽  
Transversally Isotropic

Introduction. An efficient technique of tensor field scalarization  is  successfully  used  while  investigating  tensor  elastic fields of displacements, stresses and deformations in the layered structures of different materials, including transversally isotropic composites. These fields can be expressed through the scalar potentials corresponding to the quasi-longitudinal, quasi-transverse, and transverse-only waves. Such scalarization is possible if the objects under consideration are tensors relating to  the subgroup  of general coordinate conversions, when the local affine basis has one invariant vector that coincides with the material symmetry axis of the material. At this, the known papers consider structures where this vector coincides with the normal to the boundary between layers. However, other cases of the mutual arrangement of the material symmetry axis of the  material  and  the boundaries between layers are of interest on the practical side.Materials and Methods. The work objective is further development of the scalarization method application in the boundary value problems of the dynamic  elasticity theory for the cases of an arbitrary arrangement of the material symmetry axis relative to the boundary between layers. The present research and methodological apparatus are developed through the general technique of scalarization of the dynamic elastic fields of displacements, stresses and strains in the transversally isotropic media.Research Results. New design ratios for the determination of the displacement fields, stresses and deformations in the transversally isotropic media are obtained for the cases of an arbitrary arrangement of the material symmetry axes of the layer materials with respect to the boundaries between layers. Discussion and Conclusions. The present research and methodological apparatus are successfully used in determining the stress-strain  state  in  the  layered  structures  of  transversally isotropic materials, and in analyzing the diagnosis results of the state of the plane-layered and layered cylindrical structures under operation.

Long-offset moveout for VTI using Padé approximation

Geophysics ◽  
2016 ◽  
Vol 81 (5) ◽  
pp. C219-C227 ◽  
Author(s):  
Hanjie Song ◽  
Yingjie Gao ◽  
Jinhai Zhang ◽  
Zhenxing Yao
Keyword(s):  
Padé Approximation ◽  
Pade Approximation ◽  
Practical Applications ◽  
Long Offset ◽  
Wide Range ◽  
Isotropic Media ◽  
Transversally Isotropic ◽  
Error Accumulation ◽  
Anisotropy Parameters ◽  
Vti Media

The approximation of normal moveout is essential for estimating the anisotropy parameters of the transversally isotropic media with vertical symmetry axis (VTI). We have approximated the long-offset moveout using the Padé approximation based on the higher order Taylor series coefficients for VTI media. For a given anellipticity parameter, we have the best accuracy when the numerator is one order higher than the denominator (i.e., [[Formula: see text]]); thus, we suggest using [4/3] and [7/6] orders for practical applications. A [7/6] Padé approximation can handle a much larger offset and stronger anellipticity parameter. We have further compared the relative traveltime errors between the Padé approximation and several approximations. Our method shows great superiority to most existing methods over a wide range of offset (normalized offset up to 2 or offset-to-depth ratio up to 4) and anellipticity parameter (0–0.5). The Padé approximation provides us with an attractive high-accuracy scheme with an error that is negligible within its convergence domain. This is important for reducing the error accumulation especially for deeper substructures.

Equivalence of periodically layered and transversally isotropic media

1982 ◽  
Vol 19 (4) ◽  
pp. 1454-1466 ◽  
Author(s):  
L. A. Molotkov
Keyword(s):  
Isotropic Media ◽  
Transversally Isotropic

Origin of the alternate bright/dark contrast in HREM images of hexagonal crystals, particularly 6H-SiC

1993 ◽  
Vol 51 ◽  
pp. 914-915
Author(s):  
J.S. Bow ◽  
R.W. Carpenter ◽  
M.J. Kim
Keyword(s):  
High Resolution ◽  
Incident Beam ◽  
Hexagonal Crystal ◽  
Detailed Explanation ◽  
Similar Character ◽  
High Resolution Images ◽  
The Difference ◽  
Zigzag Shape ◽  
Hexagonal Crystals ◽  
Dark Contrast

A prominent characteristic of high-resolution images of 6H-SiC viewed from [110] is a zigzag shape with a period of 6 layers as shown in Fig.1. Sometimes the contrast is same through the 6 layers of (0006) planes (Fig.1a), but in most cases it appears as in Fig.1b -- alternate bright/dark contrast among every three (0006) planes. Alternate bright/dark contrast is most common for the thicker specimens. The SAD patterns of these two types of image are almost same, and there is no indication that the difference results from compositional ordering. O’Keefe et al. concluded this type of alternate contrast was due to crystal tilt in thick parts of the specimen. However, no detailed explanation was given. Images of similar character from Ti3Al, which is also a hexagonal crystal, were reported by Howe et al. Howe attributed the bright/dark contrast among alternate (0002) Ti3Al planes to phase shifts produced by incident beam tilt.

Simulation and Contrast Analysis of tem Images of Cracks

1990 ◽  
Vol 48 (1) ◽  
pp. 578-579
Author(s):  
D. Goyal ◽  
A. H. King
Keyword(s):  
Displacement Vector ◽  
Crack Tip ◽  
Perfect Crystal ◽  
Operating Conditions ◽  
Displacement Fields ◽  
Fringe Contrast ◽  
Orthogonal Geometry ◽  
Moire Fringe ◽  
Moiré Fringe

TEM images of cracks have been found to give rise to a moiré fringe type of contrast. It is apparent that the moire fringe contrast is observed because of the presence of a fault in a perfect crystal, and is characteristic of the fault geometry and the diffracting conditions in the TEM. Various studies have reported that the moire fringe contrast observed due to the presence of a crack in an otherwise perfect crystal is distinctive of the mode of crack. This paper describes a technique to study the geometry and mode of the cracks by comparing the images they produce in the TEM because of the effect that their displacement fields have on the diffraction of electrons by the crystal (containing a crack) with the corresponding theoretical images. In order to formulate a means of matching experimental images with theoretical ones, displacement fields of dislocations present (if any) in the vicinity of the crack are not considered, only the effect of the displacement field of the crack is considered.The theoretical images are obtained using a computer program based on the two beam approximation of the dynamical theory of diffraction contrast for an imperfect crystal. The procedures for the determination of the various parameters involved in these computations have been well documented. There are three basic modes of crack. Preliminary studies were carried out considering the simplest form of crack geometries, i. e., mode I, II, III and the mixed modes, with orthogonal crack geometries. It was found that the contrast obtained from each mode is very distinct. The effect of variation of operating conditions such as diffracting vector (), the deviation parameter (ω), the electron beam direction () and the displacement vector were studied. It has been found that any small change in the above parameters can result in a drastic change in the contrast. The most important parameter for the matching of the theoretical and the experimental images was found to be the determination of the geometry of the crack under consideration. In order to be able to simulate the crack image shown in Figure 1, the crack geometry was modified from a orthogonal geometry to one with a crack tip inclined to the original crack front. The variation in the crack tip direction resulted in the variation of the displacement vector also. Figure 1 is a cross-sectional micrograph of a silicon wafer with a chromium film on top, showing a crack in the silicon.

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