Determination of attenuation and phase velocity of hypersound by multiple-beam interferometry in evaporated wedge-shaped metal films

1981 ◽  
Vol 44 (3) ◽  
pp. 167-175 ◽  
Author(s):  
B. Lehr ◽  
H. Ulrich ◽  
O. Weis
Keyword(s):  
Phase Velocity ◽  
Metal Films ◽  
Multiple Beam ◽  
Multiple Beam Interferometry

Characterization and Manipulation of Exposed Ge Nanocrystals

2004 ◽  
Vol 818 ◽  
Author(s):  
I.D. Sharp ◽  
Q. Xu ◽  
C.Y. Liao ◽  
D.O. Yi ◽  
J.W. Ager ◽  
...  
Keyword(s):  
Hydrofluoric Acid ◽  
Metal Films ◽  
Silica Matrix ◽  
Size Distributions ◽  
Si Substrates ◽  
Atomic Force ◽  
Transmission Electron ◽  
Oxide Matrix ◽  
Ge Nanocrystals

AbstractIsotopically pure 70Ge and 74Ge nanocrystals embedded in SiO2 thin films on Si substrates have been fabricated through ion implantation and thermal annealing. Nanocrystals were subsequently exposed using a hydrofluoric acid etching procedure to selectively remove the oxide matrix while retaining up to 69% of the implanted Ge. Comparison of transmission electron micrographs (TEM) of as-grown crystals to atomic force microscope (AFM) data of exposed crystals reveals that the nanocrystal size distribution is very nearly preserved during etching. Therefore, this process provides a new means to use AFM for rapid and straightforward determination of size distributions of nanocrystals formed in a silica matrix. Once exposed, nanocrystals may be transferred to a variety of substrates, such as conducting metal films and optically transparent insulators for further characterization.

Measurement of the refractive index of solids by multiple-beam interferometry

1979 ◽  
Vol 22 (2) ◽  
pp. 146-148
Author(s):  
E. A. Volkova ◽  
A. L. �tsina
Keyword(s):  
Refractive Index ◽  
Multiple Beam ◽  
Multiple Beam Interferometry
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