scholarly journals Simulation of yield reduction by leaf rust in winter wheat, applied to the analysis of genetic variation in partial resistance

1990 ◽  
Vol 96 (1) ◽  
pp. 17-28 ◽  
Author(s):  
H. J. W. Roermund ◽  
C. J. T. Spitters
1990 ◽  
Vol 96 (1) ◽  
pp. 3-15 ◽  
Author(s):  
C. J. T. Spitters ◽  
H. J. W. Roermund ◽  
H. G. M. G. Nassau ◽  
J. Schepers ◽  
J. Mesdag

Crop Science ◽  
1996 ◽  
Vol 36 (6) ◽  
pp. 1595-1601 ◽  
Author(s):  
Silvano Ortelli ◽  
Michael Winzeler ◽  
Hans Winzeler ◽  
Josef Nösberger

Crop Science ◽  
1996 ◽  
Vol 36 (6) ◽  
pp. 1590-1595 ◽  
Author(s):  
Silvano Ortelli ◽  
Hans Winzeler ◽  
Michael Winzeler ◽  
Padruot M. Fried ◽  
Josef Nösberger

1983 ◽  
Vol 63 (3) ◽  
pp. 623-630 ◽  
Author(s):  
J. M. MARTIN ◽  
D. E. MATHRE ◽  
R. H. JOHNSTON

The objectives of our research were to determine the magnitude of genetic variation for reaction to Cephalosporium gramineum and to investigate the relationship among indices measuring host reaction to C. gramineum in four winter wheat crosses. PI 278212 and MT 7579 (resistance sources) were each crossed with Marias and Winalta (adapted tester lines). Seventy random F2-derived F3 progenies per cross were planted in nonreplicated rows and were inoculated with C. gramineum. Visual disease scores were recorded on a scale of 0 to 5 (0 = no white heads and 5 = 100% white heads). The F2-derived F4 progenies were planted in a replicated yield trial with control and adjacent inoculated plots the following season. Cephalosporium gramineum caused significant yield loss in all crosses and in all parents except PI 278212. Comparisons among cross means showed that mean symptom expression approached the resistant parent in all crosses. Crosses from MT 7579 had greater yield in both control and inoculated conditions but had greater yield reduction than crosses from PI 278212. Parents performed similarly in cross combinations, as there was no significant resistance source × tester line interaction. F3 disease score was not a reliable predictor of F4 inoculated yield or yield reduction. Estimates of genetic variance components and heritabilities pooled over crosses were largest relative to their standard errors for inoculated yield and smallest for yield reduction. Phenotypic and genotypic correlations were of the same sign and nearly the same magnitude with inoculated yield being positively correlated with control yield and negatively correlated with yield reduction.Key words: Cephalosporium stripe, winter wheat, host reaction


Author(s):  
G. V. Volkova ◽  
O. A. Kudinova ◽  
O. F. Vaganova

Currently, more than 70 wheat rust resistance genes are known, but few of them are effective. The purpose of this work is to screen lines of Lr gene carriers for resistance to leaf rust under conditions of the North Caucasus region. Investigations were carried out in 2016-2018 at the infectious site of VNIIBZR. Research material was 49 near isogenic lines of winter wheat cultivar Thatcher. Infectious material was the combined populations of P. triticina, obtained as a result of route surveys of industrial and breeding crops of winter wheat in the areas of the Krasnodar, Stavropol Territories and the Rostov Region, conducted in 2016-2018. According to the assessment, the genes are ranked as follows: - highly efficient genes (plants with no signs of damage): Lr9, Lr42, Lr43 + 24 and Lr50; effective (1R-5R) Lr genes: 19, 24, 29, 36, 37, 38, 45, 47; moderately effective (10MR-20MR) Lr genes: 17, 18, 21, 22a, 28, 32, 41, 52. The remaining Lr-lines were susceptible to P. triticina (25 MR - 90S) to varying degrees. Highly efficient and effective genes Lr9, Lr19, Lr24, Lr29, Lr38, Lr42, Lr43 + 24, Lr47 and Lr50 showed resistance in the seedling phase and can be recommended for inclusion in breeding programs to protect wheat from leaf rust in different phases of plant ontogenesis in the North Caucasus region.


Plant Disease ◽  
2015 ◽  
Vol 99 (9) ◽  
pp. 1261-1267 ◽  
Author(s):  
J. A. Kolmer ◽  
M. E. Hughes

Collections of Puccinia triticina were obtained from rust-infected leaves provided by cooperators throughout the United States and from wheat fields and breeding plots by USDA-ARS personnel and cooperators in the Great Plains, Ohio River Valley, and southeastern states in order to determine the virulence of the wheat leaf rust population in 2013. Single uredinial isolates (490 total) were derived from the collections and tested for virulence phenotype on 20 lines of Thatcher wheat that are near-isogenic for leaf rust resistance genes. In 2013, 79 virulence phenotypes were described in the United States. Virulence phenotypes MBTNB, TNBGJ, and MCTNB were the three most common phenotypes. Phenotypes MBTNB and MCTNB are both virulent to Lr11, and MCTNB is virulent to Lr26. MBTNB and MCTNB were most common in the soft red winter wheat region of the southeastern states and Ohio Valley. Phenotype TNBGJ is virulent to Lr39/41 and was widely distributed throughout the hard red winter wheat region of the Great Plains. Isolates with virulence to Lr11, Lr18, and Lr26 were common in the southeastern states and Ohio Valley region. Isolates with virulence to Lr21, Lr24, and Lr39/41 were frequent in the hard red wheat region of the southern and northern Great Plains.


Crop Science ◽  
2018 ◽  
Vol 58 (1) ◽  
pp. 152-158 ◽  
Author(s):  
J. A. Kolmer ◽  
S. Chao ◽  
G. Brown-Guedira ◽  
U. Bansal ◽  
H. Bariana

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