Layer removal analysis of residual stress

1989 ◽  
Vol 24 (10) ◽  
pp. 3521-3528 ◽  
Author(s):  
M. W. A. Paterson ◽  
J. R. White
2007 ◽  
Vol 40 (4) ◽  
pp. 675-683 ◽  
Author(s):  
Cristy L. Azanza Ricardo ◽  
Mirco D'Incau ◽  
Paolo Scardi

A new procedure is proposed to determine sub-surface residual stress gradients by laboratory X-ray diffraction measurements at different depths using a chemical layer-removal technique. The standard correction algorithm for stress relaxation due to layer removal is improved by including corrections for X-ray absorption, and by the addition of constraints imposed by the mechanical equilibrium conditions. Besides correcting the data,i.e.providing more reliable through-thickness residual stress trends, the proposed procedure also provides an elastically compatible and plausible estimate of the residual stress inside the component, well beyond the measured region. The application of the model is illustrated for a set of Al-alloy components shot-peened at different Almen intensities. Results are compared with those given by `blind hole drilling', which is an independent and partly destructive method.


Author(s):  
Partha Rangaswamy ◽  
N. Jayaraman

Abstract In metal matrix composites residual stresses developing during the cool-down process after consolidation due to mismatch in thermal expansion coefficients between the ceramic fibers and metal matrix have been predicted using finite element analysis. Conventionally, unit cell models consisting of a quarter fiber surrounded by the matrix material have been developed for analyzing this problem. Such models have successfully predicted the stresses at the fiber-matrix interface. However, experimental work to measure residual stresses have always been on surfaces far away from the interface region. In this paper, models based on the conventional unit cell (one quarter fiber), one fiber, two fibers have been analyzed. In addition, using the element birth/death options available in the FEM code, the surface layer removal process that is conventionally used in the residual stress measuring technique has been simulated in the model. Such layer removal technique allows us to determine the average surface residual stress after each layer is removed and a direct comparison with experimental results are therefore possible. The predictions are compared with experimental results of an eight-ply unidirectional composite with Ti-24Al-11 Nb as matrix material reinforced with SCS-6 fibers.


2013 ◽  
Vol 768-769 ◽  
pp. 420-427 ◽  
Author(s):  
Jeremy Epp ◽  
Thilo Pirling ◽  
Thomas Hirsch

In this paper the microstructural and residual-stress analysis of an induction hardened plate of medium carbon steel is described. The stress gradient was determined using laboratory X-ray diffraction (IWT, Bremen, Germany) and neutron strain scanning (ILL, Grenoble, France). Due to slight variations of chemical composition in the depth, matchstick like (cross section 2×2mm²) d0-reference samples were prepared from a similarly treated sample. The d0shift induced by variation of chemical composition was measured by neutron and by X-ray diffraction along the strain free direction (sin²ψ*) and used for the evaluation of the neutron stress calculation. The d0distribution obtained from the neutron measurement did not appear reliable while the method using X-ray diffraction seems to be an efficient and reliable method to determine d0profiles in small samples. The evaluation of neutron measurements was then done using the X-ray diffraction d0distribution. High compressive residual stresses were measured in the hardened layer followed by high tensile residual stresses in the core. A comparison of the neutron measurements with X-ray diffraction (XRD) depth profiles obtained after successive layer removal showed that both methods give similar results. However, these investigations opened the question about the direct comparison of the residual stresses obtained by neutron and XRD. Indeed, a correction of the neutron data regarding the residual stresses in thickness direction might be necessary as these are released in the case of X-ray diffraction measurements after layer removal.


2014 ◽  
Vol 996 ◽  
pp. 175-180 ◽  
Author(s):  
Rasha Alkaisee ◽  
Ru Lin Peng

For X-Ray Diffraction Measurement of Depth Profiles of Residual Stress, Step-Wise Removal of Materials has to be Done to Expose the Underneath Layers to the X-Rays. this Paper Investigates the Influence of Layer Removal Methods, Including Electro-Polishing in Two Different Electrolytes and Chemical Etching, on the Accuracy of Residual Stress Measurement. Measurements on Two Shot-Peened Steels Revealed Large Discrepancy in Subsurface Distributions of Residual Stress Obtained with the Respective Methods. Especially, the Chemical Etching Yielded much Lower Subsurface Compressive Stresses than the Electro-Polishing Using a so Called AII Electrolyte. the Difference was Explained by the Influence of the Different Layer Removal Methods on the Microscopic Roughness.


1999 ◽  
Vol 39 (10) ◽  
pp. 2030-2041 ◽  
Author(s):  
K. M. B. Jansen ◽  
J. J. W. Orij ◽  
C. Z. Meijer ◽  
D. J. Van Dijk

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