FLIM on a wide field fluorescence microscope

2003 ◽  
Vol 10 (5-6) ◽  
pp. 501-510 ◽  
Author(s):  
L. K. van Geest ◽  
K. W. J. Stoop
Keyword(s):  
Fluorescence Microscope ◽  
Wide Field

FLIM on a wide field fluorescence microscope

2003 ◽  
Vol 10 (5-6) ◽  
pp. 501-510 ◽  
Author(s):  
L. K. van. Geest ◽  
K. W. J. Stoop
Keyword(s):  
Fluorescence Microscope ◽  
Wide Field

A Wide-Field Fluorescence Microscope Extension for Ultrafast Screening of One-Bead One-Compound Libraries Using a Spectral Image Subtraction Approach

2016 ◽  
Vol 18 (5) ◽  
pp. 209-219 ◽  
Author(s):  
Wolf Heusermann ◽  
Beat Ludin ◽  
Nhan T Pham ◽  
Manfred Auer ◽  
Thomas Weidemann ◽  
...  
Keyword(s):  
Fluorescence Microscope ◽  
Wide Field ◽  
Image Subtraction ◽  
Spectral Image ◽  
Compound Libraries

scholarly journals So You're Trying to Choose a Confocal Microscope

1999 ◽  
Vol 7 (4) ◽  
pp. 20-23
Author(s):  
Ted Inoue
Keyword(s):  
Confocal Microscope ◽  
Fluorescence Microscope ◽  
Wide Field ◽  
Image Visualization ◽  
The Many ◽  
The Right

If you are one of the many people who are currently considering the purchase of a confocal microscope, you may be asking yourself, "How can 1 be sure that the microscope I choose is the right one?"Before proceeding, take a step back. Ask yourself: "Why use a confocal?" A confocal microscope is, by definition, a microscope which optically "slices" the sample by showing only those details which are at or near the plane of focus. This results in a clearer image than might be possible with a conventional (also called "wide-field") fluorescence microscope - a microscope in which every pixel in every image is corrupted by light from its neighbors. The optical slicing of the sample done by the confocal microscope lets you construct a 3-D representation of the sample that can be very useful for image visualization or analysis.

STM studies of crystal growth

1991 ◽  
Vol 49 ◽  
pp. 374-375
Author(s):  
M. G. Lagally
Keyword(s):  
Crystal Growth ◽  
Molecular Beam ◽  
Chemical Vapor ◽  
Sputter Deposition ◽  
Field Of View ◽  
Scanning Tunneling ◽  
Wide Field ◽  
Tunneling Microscopy ◽  
Wide Field Of View ◽  
The One

It has been recognized since the earliest days of crystal growth that kinetic processes of all Kinds control the nature of the growth. As the technology of crystal growth has become ever more refined, with the advent of such atomistic processes as molecular beam epitaxy, chemical vapor deposition, sputter deposition, and plasma enhanced techniques for the creation of “crystals” as little as one or a few atomic layers thick, multilayer structures, and novel materials combinations, the need to understand the mechanisms controlling the growth process is becoming more critical. Unfortunately, available techniques have not lent themselves well to obtaining a truly microscopic picture of such processes. Because of its atomic resolution on the one hand, and the achievable wide field of view on the other (of the order of micrometers) scanning tunneling microscopy (STM) gives us this opportunity. In this talk, we briefly review the types of growth kinetics measurements that can be made using STM. The use of STM for studies of kinetics is one of the more recent applications of what is itself still a very young field.

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

Wide-field subsecond temporal resolution optical monitoring systems for detection and study of cosmic hazards

2013 ◽  
Vol 183 (8) ◽  
pp. 888-894
Author(s):  
G.M. Beskin ◽  
S.V. Karpov ◽  
V.L. Plokhotnichenko ◽  
S.F. Bondar ◽  
A.V. Perkov ◽  
...  
Keyword(s):  
Temporal Resolution ◽  
Monitoring Systems ◽  
Wide Field ◽  
Optical Monitoring

Discovery of the fast optical variability of GRB 080319B and the prospects for wide-field optical monitoring with high time resolution

2010 ◽  
Vol 180 (4) ◽  
pp. 424 ◽  
Author(s):  
G.M. Beskin ◽  
S.V. Karpov ◽  
S.F. Bondar ◽  
V.L. Plokhotnichenko ◽  
A. Guarnieri ◽  
...  
Keyword(s):  
Time Resolution ◽  
High Time ◽  
High Time Resolution ◽  
Optical Variability ◽  
Wide Field ◽  
Optical Monitoring
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