In situ observation of solidification of silicon steel by synchrotron radiation X-ray topography

1987 ◽  
Vol 18 (4) ◽  
pp. 723-727 ◽  
Author(s):  
Tooru Matsumiya ◽  
Wataru Yamada ◽  
Tetsuro Ohashi ◽  
Osamu Nittono
2014 ◽  
Vol 905 ◽  
pp. 88-91
Author(s):  
Hou Kui Fu ◽  
De Bo Lu ◽  
Zi Guo Li

In-situ observation of stress in Al interconnects under electromigration and thermal effect by using the synchrotron radiation x-ray diffraction. The test temperature was controlled by changing the current density of W (self-heating structure). The EM-induced stress was also investigated with current densities from 3x105A/cm2 to 4x106A/cm2.The conclusion agreed well with the simulation results.


CrystEngComm ◽  
2013 ◽  
Vol 15 (2) ◽  
pp. 302-314 ◽  
Author(s):  
Laura Bayés-García ◽  
Teresa Calvet ◽  
Miquel Àngel Cuevas-Diarte ◽  
Satoru Ueno ◽  
Kiyotaka Sato

2010 ◽  
Vol 25 (2) ◽  
pp. 292-295 ◽  
Author(s):  
Albert T. Wu ◽  
Ciou-Nan Siao ◽  
Ching-Shun Ku ◽  
Hsin-Yi Lee

This investigation elucidates stress evolution in situ in tin strips under electromigration using synchrotron radiation x-ray. Minute variations in stress are determined precisely using intense x-rays. Back stresses gradient with the values of 5.5 and 16.5 MPa/cm, which are induced by the current densities of 1 × 103 and 5 × 103 A/cm2, respectively, are measured directly. The effective diffusivities that include both grain and lattice diffusion at various current densities are determined. The Joule heating is observed, ranging from 5 to 15 °C, according to various current densities passed through the stripes. Results of this study suggest that the protective oxide layer on the surfaces significantly influences the kinetics of stress evolution.


Hyomen Kagaku ◽  
2014 ◽  
Vol 35 (4) ◽  
pp. 190-195 ◽  
Author(s):  
Noriyuki YOSHIMOTO ◽  
Takeshi WATANABE ◽  
Tomoyuki KOGANEZAWA ◽  
Mamoru KIKUCHI ◽  
Ichiro HIROSAWA

1993 ◽  
Vol 308 ◽  
Author(s):  
Paul R. Besser ◽  
Thomas N. Marieb ◽  
John C. Bravman

ABSTRACTStrain relaxation in passivated Al-0.5% Cu lines was measured using X-ray diffraction coupled with in-situ observation of the formation and growth of stress induced voids. Samples of 1 μm thick Al-0.5% Cu lines passivated with Si3N4 were heated to 380ºC, then cooled and held at 150ºC. During the test, principal strains along the length, width, and height of the line were determined using a grazing incidence x-ray geometry. From these measurements the hydrostatic strain in the metal was calculated and strain relaxation was observed. The thermal cycle was duplicated in a high voltage scanning transmission electron microscope equipped with a backscattered electron detector. The 1.25 μm wide lines were seen to have initial stress voids. Upon heating these voids reduced in size until no longer observable. Once the samples were cooled to 150ºC, voids reappeared and grew. The measured strain relaxation is discussed in terms of void and θ-phase (Al2Cu) formation.


ChemInform ◽  
2006 ◽  
Vol 37 (12) ◽  
Author(s):  
Katsuhiro Kobayashi ◽  
Tadashi Hata ◽  
Hiroshi Fukuhara ◽  
Yuji Ohashi
Keyword(s):  

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.


2011 ◽  
Vol 59 (5) ◽  
pp. 1995-2008 ◽  
Author(s):  
H. Toda ◽  
E. Maire ◽  
S. Yamauchi ◽  
H. Tsuruta ◽  
T. Hiramatsu ◽  
...  

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.


Nanoscale ◽  
2016 ◽  
Vol 8 (4) ◽  
pp. 1849-1853 ◽  
Author(s):  
S. E. R. Tay ◽  
A. E. Goode ◽  
J. Nelson Weker ◽  
A. A. Cruickshank ◽  
S. Heutz ◽  
...  

The nucleation and growth of a nanostructure controls its size and morphology, and ultimately its functional properties.


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