scholarly journals Comparing orthomagmatic and hydrothermal mineralization models for komatiite-hosted nickel deposits in Zimbabwe using multiple-sulfur, iron, and nickel isotope data

2013 ◽  
Vol 49 (1) ◽  
pp. 75-100 ◽  
Author(s):  
Axel Hofmann ◽  
Andrey Bekker ◽  
Paul Dirks ◽  
Bleuenn Gueguen ◽  
Doug Rumble ◽  
...  
Mineralogia ◽  
2012 ◽  
Vol 43 (3-4) ◽  
pp. 213-222 ◽  
Author(s):  
Wojciech Mayer ◽  
Mariusz Orion Jędrysek ◽  
Maciej Górka ◽  
Wojciech Drzewicki ◽  
Ksenia Mochnacka ◽  
...  

AbstractPreliminary sulphur isotope data are presented for selected ore deposits and occurrences in the Karkonosze-Izera Massif, namely, polymetallic mineralization sites at Budniki, Ciechanowice, Izerskie Garby and Sowia Dolina, and the pyrite deposit at Wieściszowice. The data reveal two populations of δ34S values: from 2.74 to 3.95‰ (pyrrhotites and pyrites in Sowia Dolina, and some pyrites in Wieściszowice) and from 0.79 to 1.8‰ (pyrites in Budniki, Ciechanowice and Izerskie Garby, and some pyrites from Wieściszowice). All of the data are indicative of endogenic sulphur typical of hydrothermal mineralization despite the genetic differences between the sites.


2002 ◽  
Vol 52 (1) ◽  
pp. 15-23 ◽  
Author(s):  
Jingwen MAO ◽  
Yitian WANG ◽  
Tiping DING ◽  
Yuchuan CHEN ◽  
Jiaxiu WEI ◽  
...  

Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2017 ◽  
Vol 23 (5-6) ◽  
pp. 299-313 ◽  
Author(s):  
Tiziano Boschetti ◽  
Lorenzo Toscani ◽  
Paola Iacumin ◽  
Enricomaria Selmo

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