Dynamic Error Compensation of Coordinate Measuring Machines for High-Speed Measurement

1999 ◽  
Vol 15 (11) ◽  
pp. 810-814 ◽  
Author(s):  
Y. H. Mu ◽  
B. K. A. Ngoi
Keyword(s):  
Error Compensation ◽  
High Speed ◽  
Dynamic Error ◽  
Coordinate Measuring Machines ◽  
Speed Measurement

scholarly journals Current-limiting amplifier for high speed measurement of resistive switching data

2021 ◽  
Vol 92 (5) ◽  
pp. 054701
Author(s):  
T. Hennen ◽  
E. Wichmann ◽  
A. Elias ◽  
J. Lille ◽  
O. Mosendz ◽  
...  
Keyword(s):  
Resistive Switching ◽  
High Speed ◽  
Limiting Amplifier ◽  
Speed Measurement ◽  
Current Limiting

Development of high speed measurement system for cell-scaffold interaction

2015 ◽  
Author(s):  
Yu Hirano ◽  
Masaru Kojima ◽  
Mitsuhiro Horade ◽  
Kazuto Kamiyama ◽  
Yasushi Mae ◽  
...  
Keyword(s):  
Measurement System ◽  
High Speed ◽  
Speed Measurement ◽  
Cell Scaffold

Ripple Technique; a Novel Non-Contact Wafer Emissivity and Temperature Method for RTP

1991 ◽  
Vol 224 ◽  
Author(s):  
C. Schietinger ◽  
B. Adams ◽  
C. Yarling
Keyword(s):  
Optical Fiber ◽  
Measurement Technique ◽  
Thermal Processing ◽  
High Speed ◽  
Rapid Thermal Processing ◽  
Wafer Surface ◽  
Speed Measurement ◽  
Temperature Method ◽  
Emissivity Measurement ◽  
Emissivity Measurements

AbstractA novel wafer temperature and emissivity measurement technique for rapid thermal processing (RTP) is presented. The ‘Ripple Technique’ takes advantage of heating lamp AC ripple as the signature of the reflected component of the radiation from the wafer surface. This application of Optical Fiber Thermometry (OFT) allows high speed measurement of wafer surface temperatures and emissivities. This ‘Ripple Technique’ is discussed in theoretical and practical terms with wafer data presented. Results of both temperature and emissivity measurements are presented for RTP conditions with bare silicon wafers and filmed wafers.

THE DESIGN AND FABRICATION OF HIGH-SPEED HBT CIRCUITS FOR FIBER-OPTIC COMMUNICATION SYSTEMS

1994 ◽  
Vol 05 (03) ◽  
pp. 253-274 ◽  
Author(s):  
MASAO OBARA ◽  
JUNKO AKAGI
Keyword(s):  
Measurement System ◽  
Communication Systems ◽  
High Speed ◽  
Fiber Optic ◽  
Heterojunction Bipolar Transistor ◽  
Fiber Amplifiers ◽  
Speed Measurement ◽  
Fiber Optic Communication ◽  
Optical Fiber Amplifiers ◽  
Optic Communication

AlGaAs/GaAs heterojunction bipolar transistor (HBT) high speed ICs have been paving the way for the most sophisticated fiber-optic communication systems since the late 1980s. Recently 20 Gbps HBT ICs have been developed to accommodate the emergence of optical fiber amplifiers. HBT technology is now proceeding towards the development of 40 Gbps systems where the lack of high speed measurement system remains an issue.

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