scholarly journals Nuclear effect in higher-dimensional factorial moment analysis of the $^{16}$ O-, $^{32}$ S- and $^{197}$ Au-Em interaction data at 200, 60 and 11 A GeV/c

1997 ◽  
Vol 76 (4) ◽  
pp. 659-663 ◽  
Author(s):  
M.I. Adamovich et al.
1990 ◽  
Vol 65 (4) ◽  
pp. 412-415 ◽  
Author(s):  
M. I. Adamovich ◽  
M. M. Aggarwal ◽  
Y. A. Alexandrov ◽  
Z. V. Ameeva ◽  
N. P. Andreeva ◽  
...  

1999 ◽  
Vol 14 (23) ◽  
pp. 3687-3697 ◽  
Author(s):  
GANG CHEN ◽  
LIANSHOU LIU ◽  
YANMIN GAO

It is pointed out that in doing the factorial moment analysis with noninteger partition M of phase–space, the influence of the phase–space variation of two (or more) particle correlations has to be considered carefully. In this paper this problem is studied and a systematic method is developed to minimize this influence. The efficiency and self-consistency of this method are shown using the data of 250 GeV /c π+p and K+p collisions from the NA22 experiment as example.


2011 ◽  
Vol 21 (2) ◽  
pp. 44-54
Author(s):  
Kerry Callahan Mandulak

Spectral moment analysis (SMA) is an acoustic analysis tool that shows promise for enhancing our understanding of normal and disordered speech production. It can augment auditory-perceptual analysis used to investigate differences across speakers and groups and can provide unique information regarding specific aspects of the speech signal. The purpose of this paper is to illustrate the utility of SMA as a clinical measure for both clinical speech production assessment and research applications documenting speech outcome measurements. Although acoustic analysis has become more readily available and accessible, clinicians need training with, and exposure to, acoustic analysis methods in order to integrate them into traditional methods used to assess speech production.


2015 ◽  
Vol 105 (39) ◽  
pp. 1-8
Author(s):  
Shehong Liu ◽  
Juyun Yuan ◽  
Xin Zhao

2018 ◽  
Author(s):  
Peter De Wolf ◽  
Zhuangqun Huang ◽  
Bede Pittenger

Abstract Methods are available to measure conductivity, charge, surface potential, carrier density, piezo-electric and other electrical properties with nanometer scale resolution. One of these methods, scanning microwave impedance microscopy (sMIM), has gained interest due to its capability to measure the full impedance (capacitance and resistive part) with high sensitivity and high spatial resolution. This paper introduces a novel data-cube approach that combines sMIM imaging and sMIM point spectroscopy, producing an integrated and complete 3D data set. This approach replaces the subjective approach of guessing locations of interest (for single point spectroscopy) with a big data approach resulting in higher dimensional data that can be sliced along any axis or plane and is conducive to principal component analysis or other machine learning approaches to data reduction. The data-cube approach is also applicable to other AFM-based electrical characterization modes.


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